Inventor

YANG LIEN-SHENG

TW7 patents

⚠️ This page may combine multiple inventors who share the name “YANG LIEN-SHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ETRON TECHNOLOGY INC

2 patents

US7965577B2Jun 21, 2011

Word line defect detecting device and method thereof

ETRON TECHNOLOGY INC11 citations79

US7623388B2Nov 24, 2009

Method for detecting erroneous word lines of a memory array and device thereof

ETRON TECHNOLOGY INC7 citations67

INTEGRATED SILICON SOLUTION INC

2 patents

US11378620B2Jul 5, 2022

Method and system for detecting abnormal die

INTEGRATED SILICON SOLUTION INC0 citations39

US11195592B2Dec 7, 2021

Memory inspecting method and memory inspecting system

INTEGRATED SILICON SOLUTION INC0 citations39

INTEGRATED CIRCUIT SOLUTION INC

1 patent

US9153344B1Oct 6, 2015

Device for detecting defective global word line

INTEGRATED CIRCUIT SOLUTION INC1 citations47

CHEN WEI-JU

1 patent

US8543877B2Sep 24, 2013

Method of performing a chip burn-in scanning with increased efficiency

CHEN WEI-JU0 citations36

CHANG MIN-CHIH

1 patent

US8773931B2Jul 8, 2014

Method of detecting connection defects of memory and memory capable of detecting connection defects thereof

CHANG MIN-CHIH0 citations24