Inventor
NEMOTO SHIN
JP24 patents
⚠️ This page may combine multiple inventors who share the name “NEMOTO SHIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
YAZAKI CORP
8 patentsUS9028277B2May 12, 2015
Terminal locking structure in connector housing
YAZAKI CORP7 citations84
US9601854B2Mar 21, 2017
Female terminal
YAZAKI CORP15 citations82
US9472884B2Oct 18, 2016
Connector
YAZAKI CORP8 citations82
US10840623B2Nov 17, 2020
Board-mounting connector including cylindrical portion having slit with end portions offset from one another
YAZAKI CORP2 citations72
US10158189B2Dec 18, 2018
Connector having a housing inseparably connecting two other housings
YAZAKI CORP2 citations69
US11417996B2Aug 16, 2022
Connector fitting device
YAZAKI CORP0 citations62
US9106017B2Aug 11, 2015
Terminal pullout structure of connector
YAZAKI CORP1 citations50
US10727622B2Jul 28, 2020
Board-mounted connector
YAZAKI CORP0 citations35
ADVANTEST CORP
7 patentsUS6339321B1Jan 15, 2002
Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatus
ADVANTEST CORP85 citations97
US6066822AMay 23, 2000
Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus
ADVANTEST CORP94 citations97
US5865319AFeb 2, 1999
Automatic test handler system for IC tester
ADVANTEST CORP146 citations97
US6104183AAug 15, 2000
Semiconductor device testing apparatus
ADVANTEST CORP62 citations96
US6433294B1Aug 13, 2002
Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus
ADVANTEST CORP21 citations92
US6384593B1May 7, 2002
Semiconductor device testing apparatus
ADVANTEST CORP40 citations92
US6271657B1Aug 7, 2001
Test head positioner for semiconductor device testing apparatus
ADVANTEST CORP14 citations74
SUMITOMO METAL IND
3 patentsUS4598998AJul 8, 1986
Screw surface flaw inspection method and an apparatus therefor
SUMITOMO METAL IND85 citations91
US4413324ANov 1, 1983
Temperature pattern measuring method and a device therefor
SUMITOMO METAL IND30 citations89
US4365307ADec 21, 1982
Temperature pattern measuring device
SUMITOMO METAL IND40 citations89