Inventor

KAWASAKI TAKAHIRO

JP11 patents

⚠️ This page may combine multiple inventors who share the name “KAWASAKI TAKAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

3 patents

US6046488AApr 4, 2000

Semiconductor device having conductive layer and manufacturing method thereof

MITSUBISHI ELECTRIC CORP13 citations72

US11447869B2Sep 20, 2022

Manufacturing method for solar cell, solar cell, and solar cell manufacturing apparatus

MITSUBISHI ELECTRIC CORP0 citations42

US9537026B2Jan 3, 2017

Method for manufacturing solar-power-generator substrate and apparatus for manufacturing solar-power-generator substrate

MITSUBISHI ELECTRIC CORP0 citations33

HITACHI HIGH TECH CORP

3 patents

US9514528B2Dec 6, 2016

Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus

HITACHI HIGH TECH CORP0 citations51

US11713963B2Aug 1, 2023

Pattern shape evaluation device, pattern shape evaluation system, and pattern shape evaluation method

HITACHI HIGH TECH CORP0 citations49

US10665424B2May 26, 2020

Pattern measuring method and pattern measuring apparatus

HITACHI HIGH TECH CORP0 citations40

NISHIHARA TAKASHI

2 patents

US9136567B2Sep 15, 2015

Chuck mechanism of charge-discharge test device for thin secondary battery

NISHIHARA TAKASHI2 citations60

US8618804B2Dec 31, 2013

Chuck mechanism of charge/discharge testing device for flat-rechargeable batteries

NISHIHARA TAKASHI1 citations47

KAWADA HIROKI

1 patent

US9702695B2Jul 11, 2017

Image processing device, charged particle beam device, charged particle beam device adjustment sample, and manufacturing method thereof

KAWADA HIROKI5 citations70

TOSHIBA KK

1 patent

US4726855AFeb 23, 1988

Method of annealing a core

TOSHIBA KK6 citations58

KAWASAKI TAKAHIRO

1 patent

US8742375B2Jun 3, 2014

Scanning electron microscope device, evaluation point generating method, and program

KAWASAKI TAKAHIRO3 citations54