Inventor
JEON BYEONG-HWAN
KR32 patents
⚠️ This page may combine multiple inventors who share the name “JEON BYEONG-HWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
20 patentsUS9702826B2Jul 11, 2017
Method of inspecting a surface of an object and optical system for performing the same
SAMSUNG ELECTRONICS CO LTD3 citations71
US8841824B2Sep 23, 2014
Broadband light illuminators
SAMSUNG ELECTRONICS CO LTD5 citations71
US10001444B2Jun 19, 2018
Surface inspecting method
SAMSUNG ELECTRONICS CO LTD4 citations70
US9746430B2Aug 29, 2017
Optical inspecting apparatus
SAMSUNG ELECTRONICS CO LTD4 citations70
US5159250AOct 27, 1992
Robot control method
SAMSUNG ELECTRONICS CO LTD6 citations63
US11615956B2Mar 28, 2023
Light generator including debris shielding assembly, photolithographic apparatus including the light generator
SAMSUNG ELECTRONICS CO LTD0 citations62
US11114298B2Sep 7, 2021
Light generator including debris shielding assembly, photolithographic apparatus including the light generator, and method of manufacturing integrated circuit device using the photolithographic apparatus
SAMSUNG ELECTRONICS CO LTD0 citations62
US10779388B2Sep 15, 2020
EUV generation device
SAMSUNG ELECTRONICS CO LTD1 citations62
US9425036B2Aug 23, 2016
Light source device and semiconductor manufacturing apparatus including the same
SAMSUNG ELECTRONICS CO LTD2 citations59
US9374883B2Jun 21, 2016
Plasma light source apparatus and plasma light generating method
SAMSUNG ELECTRONICS CO LTD2 citations59
US10890527B2Jan 12, 2021
EUV mask inspection apparatus and method, and EUV mask manufacturing method including EUV mask inspection method
SAMSUNG ELECTRONICS CO LTD0 citations51
US9255694B2Feb 9, 2016
Reflector structure of illumination optic system
SAMSUNG ELECTRONICS CO LTD0 citations50
US9839110B2Dec 5, 2017
Plasma light source apparatus and light source system including the same
SAMSUNG ELECTRONICS CO LTD1 citations48
US9897552B2Feb 20, 2018
Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement system
SAMSUNG ELECTRONICS CO LTD0 citations41
US9546772B2Jan 17, 2017
Rod lens for lighting apparatus, lighting apparatus including the same and semiconductor manufacturing method using the apparatus
SAMSUNG ELECTRONICS CO LTD0 citations41
US9903705B2Feb 27, 2018
Apparatus for focus control and method for manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations39
US10473579B2Nov 12, 2019
Apparatus for inspecting material property of plurality of measurement objects
SAMSUNG ELECTRONICS CO LTD0 citations38
US10431505B2Oct 1, 2019
Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface
SAMSUNG ELECTRONICS CO LTD0 citations35
US10338370B2Jul 2, 2019
Clock signal generators and substrate inspecting apparatuses having the same
SAMSUNG ELECTRONICS CO LTD0 citations35
US10733719B2Aug 4, 2020
Wafer inspection apparatus and wafer inspection method using the same
SAMSUNG ELECTRONICS CO LTD0 citations33
HYUNDAI MOBIS CO LTD
7 patentsUS11685402B2Jun 27, 2023
Autonomous driving apparatus and method
HYUNDAI MOBIS CO LTD13 citations85
US11654939B2May 23, 2023
Autonomous driving apparatus and method that outputs different warnings based on driving risk
HYUNDAI MOBIS CO LTD2 citations73
US11420653B2Aug 23, 2022
Autonomous driving apparatus and method
HYUNDAI MOBIS CO LTD2 citations73
US11805407B2Oct 31, 2023
Apparatus and method for securely updating binary data in vehicle
HYUNDAI MOBIS CO LTD2 citations72
US11479267B2Oct 25, 2022
Autonomous driving apparatus and method
HYUNDAI MOBIS CO LTD0 citations52
US12589766B2Mar 31, 2026
Autonomous driving system and method of controlling same
HYUNDAI MOBIS CO LTD0 citations51
US11560178B2Jan 24, 2023
Apparatus and method for displaying rear image of vehicle
HYUNDAI MOBIS CO LTD0 citations51