Inventor
DUNGA MOHAN
US42 patents
⚠️ This page may combine multiple inventors who share the name “DUNGA MOHAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SANDISK TECHNOLOGIES LLC
24 patentsUS10319680B1Jun 11, 2019
Metal contact via structure surrounded by an air gap and method of making thereof
SANDISK TECHNOLOGIES LLC35 citations94
US10115459B1Oct 30, 2018
Multiple liner interconnects for three dimensional memory devices and method of making thereof
SANDISK TECHNOLOGIES LLC34 citations94
US9935050B2Apr 3, 2018
Multi-tier three-dimensional memory devices including vertically shared source lines and method of making thereof
SANDISK TECHNOLOGIES LLC25 citations94
US9704588B1Jul 11, 2017
Apparatus and method for preconditioning currents to reduce errors in sensing for non-volatile memory
SANDISK TECHNOLOGIES LLC26 citations94
US10008273B2Jun 26, 2018
Cell current based bit line voltage
SANDISK TECHNOLOGIES LLC21 citations93
US9711231B1Jul 18, 2017
System solution for first read issue using time dependent read voltages
SANDISK TECHNOLOGIES LLC25 citations92
US10971240B1Apr 6, 2021
Wordline smart tracking verify
SANDISK TECHNOLOGIES LLC11 citations86
US11404123B1Aug 2, 2022
Non-volatile memory with multiple wells for word line switch transistors
SANDISK TECHNOLOGIES LLC6 citations85
US10304551B2May 28, 2019
Erase speed based word line control
SANDISK TECHNOLOGIES LLC9 citations84
US10643695B1May 5, 2020
Concurrent multi-state program verify for non-volatile memory
SANDISK TECHNOLOGIES LLC10 citations82
US10978145B2Apr 13, 2021
Programming to minimize cross-temperature threshold voltage widening
SANDISK TECHNOLOGIES LLC2 citations73
US10714169B1Jul 14, 2020
System and method for programming non-volatile memory during burst sequential write
SANDISK TECHNOLOGIES LLC2 citations73
US10559370B2Feb 11, 2020
System and method for in-situ programming and read operation adjustments in a non-volatile memory
SANDISK TECHNOLOGIES LLC5 citations73
US10074440B2Sep 11, 2018
Erase for partially programmed blocks in non-volatile memory
SANDISK TECHNOLOGIES LLC4 citations73
US10847452B2Nov 24, 2020
Non-volatile memory with capacitors using metal under signal line or above a device capacitor
SANDISK TECHNOLOGIES LLC3 citations72
US10789992B2Sep 29, 2020
Non-volatile memory with capacitors using metal under pads
SANDISK TECHNOLOGIES LLC3 citations72
US10825827B2Nov 3, 2020
Non-volatile memory with pool capacitor
SANDISK TECHNOLOGIES LLC3 citations71
US10818685B2Oct 27, 2020
Non-volatile memory with pool capacitor
SANDISK TECHNOLOGIES LLC3 citations71
US11251191B2Feb 15, 2022
Three-dimensional memory device containing multiple size drain contact via structures and method of making same
SANDISK TECHNOLOGIES LLC3 citations67
US10984876B2Apr 20, 2021
Temperature based programming in memory
SANDISK TECHNOLOGIES LLC1 citations62
US10460816B2Oct 29, 2019
Systems and methods for high-performance write operations
SANDISK TECHNOLOGIES LLC1 citations62
US11508654B2Nov 22, 2022
Non-volatile memory with capacitors using metal under signal line or above a device capacitor
SANDISK TECHNOLOGIES LLC0 citations61
US11444016B2Sep 13, 2022
Non-volatile memory with capacitors using metal under signal line or above a device capacitor
SANDISK TECHNOLOGIES LLC0 citations61
US10878926B2Dec 29, 2020
Systems and methods for high-performance write operations
SANDISK TECHNOLOGIES LLC0 citations52
SANDISK TECHNOLOGIES INC
13 patentsUS9543028B2Jan 10, 2017
Word line dependent temperature compensation scheme during sensing to counteract cross-temperature effect
SANDISK TECHNOLOGIES INC25 citations94
US9202579B2Dec 1, 2015
Compensation for temperature dependence of bit line resistance
SANDISK TECHNOLOGIES INC34 citations93
US8988939B2Mar 24, 2015
Pre-charge during programming for 3D memory using gate-induced drain leakage
SANDISK TECHNOLOGIES INC29 citations93
US8861282B2Oct 14, 2014
Method and apparatus for program and erase of select gate transistors
SANDISK TECHNOLOGIES INC14 citations93
US8988937B2Mar 24, 2015
Pre-charge during programming for 3D memory using gate-induced drain leakage
SANDISK TECHNOLOGIES INC17 citations92
US9564226B1Feb 7, 2017
Smart verify for programming non-volatile memory
SANDISK TECHNOLOGIES INC9 citations84
US9396808B2Jul 19, 2016
Method and apparatus for program and erase of select gate transistors
SANDISK TECHNOLOGIES INC5 citations84
US9443597B2Sep 13, 2016
Controlling dummy word line bias during erase in non-volatile memory
SANDISK TECHNOLOGIES INC6 citations73
US9159406B2Oct 13, 2015
Single-level cell endurance improvement with pre-defined blocks
SANDISK TECHNOLOGIES INC6 citations73
US8877627B2Nov 4, 2014
Method of forming PN floating gate non-volatile storage elements and transistor having N+ gate
SANDISK TECHNOLOGIES INC4 citations73
US9449701B1Sep 20, 2016
Non-volatile storage systems and methods
SANDISK TECHNOLOGIES INC4 citations72
US8982629B2Mar 17, 2015
Method and apparatus for program and erase of select gate transistors
SANDISK TECHNOLOGIES INC3 citations63
US12469555B2Nov 11, 2025
Unselect word line switch bias scheme for non-volatile memory apparatus
SANDISK TECHNOLOGIES INC0 citations51
WESTERN DIGITAL TECH INC
3 patentsUS9972396B1May 15, 2018
System and method for programming a memory device with multiple writes without an intervening erase
WESTERN DIGITAL TECH INC37 citations92
US10790031B1Sep 29, 2020
System handling for first read read disturb
WESTERN DIGITAL TECH INC4 citations72
US10535411B2Jan 14, 2020
System and method for string-based erase verify to create partial good blocks
WESTERN DIGITAL TECH INC0 citations42