Inventor
HSIEH KAI-CHIEH
TW24 patents
Patents
24 patentsUS11226354B1Jan 18, 2022
Probe card device and fence-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD6 citations72
US10845385B2Nov 24, 2020
Probe card device
CHUNGHWA PREC TEST TECH CO LTD5 citations72
US11561244B2Jan 24, 2023
Board-like connector, dual-ring bridge of board-like connector, and wafer testing assembly
CHUNGHWA PREC TEST TECH CO LTD2 citations71
US10845387B2Nov 24, 2020
Probe card device and matching probe thereof
CHUNGHWA PREC TEST TECH CO LTD2 citations71
US11460486B1Oct 4, 2022
Probe card device and spring-like probe
CHUNGHWA PREC TEST TECH CO LTD3 citations70
US10060949B2Aug 28, 2018
Probe device of vertical probe card
CHUNGHWA PREC TEST TECH CO LTD4 citations66
US11009526B2May 18, 2021
Probe card device and three-dimensional signal transfer structure thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations51
US11747395B2Sep 5, 2023
Board-like connector, single-arm bridge of board-like connector, and wafer testing assembly
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11699871B2Jul 11, 2023
Board-like connector, dual-arm bridge of board-like connector, and wafer testing assembly
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11073537B2Jul 27, 2021
Probe card device
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11009524B2May 18, 2021
High speed probe card device and rectangular probe
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11592466B2Feb 28, 2023
Probe card device and self-aligned probe
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11536744B2Dec 27, 2022
Probe card device and dual-arm probe
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11506685B1Nov 22, 2022
Probe card device and disposable adjustment film thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11209461B2Dec 28, 2021
Probe card device and neck-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11204371B2Dec 21, 2021
Probe card device
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11287446B2Mar 29, 2022
Split thin-film probe card
CHUNGHWA PREC TEST TECH CO LTD0 citations48
US11175313B1Nov 16, 2021
Thin-film probe card and test module thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations48
US10514390B2Dec 24, 2019
Probe structure
CHUNGHWA PREC TEST TECH CO LTD0 citations46
US11175312B2Nov 16, 2021
Staggered probe card
CHUNGHWA PREC TEST TECH CO LTD0 citations41
US10775412B2Sep 15, 2020
Probe card testing device and testing device
CHUNGHWA PREC TEST TECH CO LTD0 citations40
US10845388B2Nov 24, 2020
Probe card device and probe head thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations39
US10705117B2Jul 7, 2020
Probe assembly and probe structure thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations35
US10718791B2Jul 21, 2020
Probe assembly and probe structure thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations34