Inventor
SENOO MAKOTO
TW28 patents
⚠️ This page may combine multiple inventors who share the name “SENOO MAKOTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WINBOND ELECTRONICS CORP
24 patentsUS10304543B2May 28, 2019
Semiconductor memory device for improving high temperature data retention
WINBOND ELECTRONICS CORP7 citations84
US10297295B2May 21, 2019
Semiconductor memory device
WINBOND ELECTRONICS CORP2 citations73
US10096369B2Oct 9, 2018
Semiconductor device including a voltage generation circuit, and voltage generation circuit generates a required voltage according to internal data requested in response to an operation
WINBOND ELECTRONICS CORP3 citations73
US10032512B2Jul 24, 2018
Non-volatile semiconductor memory device
WINBOND ELECTRONICS CORP2 citations73
US11735270B2Aug 22, 2023
Semiconductor device and continuous reading method
WINBOND ELECTRONICS CORP2 citations71
US11990188B2May 21, 2024
Semiconductor apparatus and continuous readout method
WINBOND ELECTRONICS CORP0 citations62
US11495297B2Nov 8, 2022
Semiconductor device and reading method thereof
WINBOND ELECTRONICS CORP0 citations62
US11487614B2Nov 1, 2022
Semiconductor storing apparatus and readout method
WINBOND ELECTRONICS CORP0 citations62
US11423998B2Aug 23, 2022
Semiconductor device and reading method thereof
WINBOND ELECTRONICS CORP0 citations62
US10665304B2May 26, 2020
Semiconductor memory device and methods for operating a semiconductor memory device
WINBOND ELECTRONICS CORP1 citations62
US10643712B2May 5, 2020
Semiconductor memory device for improving high temperature data retention
WINBOND ELECTRONICS CORP1 citations62
US12067283B2Aug 20, 2024
Memory apparatus and memory testing method thereof for correcting ROM code having error by ECC processing unit after determined to transition to safe mode
WINBOND ELECTRONICS CORP0 citations61
US11961568B2Apr 16, 2024
Semiconductor device and reading method
WINBOND ELECTRONICS CORP0 citations61
US11488644B2Nov 1, 2022
Semiconductor device and reading method
WINBOND ELECTRONICS CORP1 citations61
US11315640B2Apr 26, 2022
Semiconductor device and continuous reading method
WINBOND ELECTRONICS CORP0 citations61
US11775205B2Oct 3, 2023
Semiconductor storage device and reading method
WINBOND ELECTRONICS CORP0 citations59
US10510421B2Dec 17, 2019
Semiconductor storage device and readout method thereof
WINBOND ELECTRONICS CORP0 citations52
US10641825B2May 5, 2020
Semiconductor storage device, operating method thereof and analysis system
WINBOND ELECTRONICS CORP0 citations51
US9613703B2Apr 4, 2017
Semiconductor memory device
WINBOND ELECTRONICS CORP1 citations51
US9214241B2Dec 15, 2015
Semiconductor memory device and erasing method
WINBOND ELECTRONICS CORP0 citations51
US11775441B2Oct 3, 2023
Semiconductor apparatus and readout method
WINBOND ELECTRONICS CORP0 citations50
US12051480B2Jul 30, 2024
Semiconductor storage device
WINBOND ELECTRONICS CORP0 citations48
US11972827B2Apr 30, 2024
Semiconductor storage device and reading method
WINBOND ELECTRONICS CORP0 citations48
US10817189B2Oct 27, 2020
Semiconductor memory device and operation setting method thereof
WINBOND ELECTRONICS CORP0 citations42