P

Inventor

LIU WEN DAR

TW34 patents
⚠️ This page may combine multiple inventors who share the name “LIU WEN DAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

VERSUM MAT US LLC

22 patents
US10870799B2Dec 22, 2020

Etching solution for selectively removing tantalum nitride over titanium nitride during manufacture of a semiconductor device

VERSUM MAT US LLC2 citations73
US12110435B2Oct 8, 2024

Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device

VERSUM MAT US LLC3 citations72
US11180697B2Nov 23, 2021

Etching solution having silicon oxide corrosion inhibitor and method of using the same

VERSUM MAT US LLC2 citations72
US10934485B2Mar 2, 2021

Etching solution for selectively removing silicon over silicon-germanium alloy from a silicon-germanium/ silicon stack during manufacture of a semiconductor device

VERSUM MAT US LLC3 citations70
US12110436B2Oct 8, 2024

Co/Cu selective wet etchant

VERSUM MAT US LLC0 citations62
US11946148B2Apr 2, 2024

Hafnium oxide corrosion inhibitor

VERSUM MAT US LLC0 citations62
US11186771B2Nov 30, 2021

Etching solution for selectively removing silicon nitride during manufacture of a semiconductor device

VERSUM MAT US LLC0 citations62
US10934484B2Mar 2, 2021

Etching solution for selectively removing silicon-germanium alloy from a silicon-germanium/ germanium stack during manufacture of a semiconductor device

VERSUM MAT US LLC1 citations62
US10301580B2May 28, 2019

Stripping compositions having high WN/W etching selectivity

VERSUM MAT US LLC1 citations62
US12281251B2Apr 22, 2025

Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device

VERSUM MAT US LLC0 citations60
US11955341B2Apr 9, 2024

Etching solution and method for selectively removing silicon nitride during manufacture of a semiconductor device

VERSUM MAT US LLC0 citations60
US11499236B2Nov 15, 2022

Etching solution for tungsten word line recess

VERSUM MAT US LLC1 citations60
US11035044B2Jun 15, 2021

Etching solution for tungsten and GST films

VERSUM MAT US LLC1 citations60
US10879076B2Dec 29, 2020

Etching solution for selectively removing silicon-germanium alloy from a silicon-germanium/silicon stack during manufacture of a semiconductor device

VERSUM MAT US LLC1 citations60
US10400167B2Sep 3, 2019

Etching compositions and methods for using same

VERSUM MAT US LLC1 citations59
US11017995B2May 25, 2021

Composition for TiN hard mask removal and etch residue cleaning

VERSUM MAT US LLC1 citations58
US10954480B2Mar 23, 2021

Compositions and methods for preventing collapse of high aspect ratio structures during drying

VERSUM MAT US LLC0 citations57
US11175587B2Nov 16, 2021

Stripper solutions and methods of using stripper solutions

VERSUM MAT US LLC1 citations56
US11929257B2Mar 12, 2024

Etching solution and method for aluminum nitride

VERSUM MAT US LLC0 citations51
US10711227B2Jul 14, 2020

TiN hard mask and etch residue removal

VERSUM MAT US LLC0 citations51
US10647950B2May 12, 2020

Cleaning formulations

VERSUM MAT US LLC0 citations51
US9957469B2May 1, 2018

Copper corrosion inhibition system

VERSUM MAT US LLC0 citations51

AIR PROD & CHEM

8 patents

RITEK CORP

2 patents

WU AIPING

1 patent

RAO MADHUKAR BHASKARA

1 patent