Inventor
TOMITA HIROSHI
JP249 patents
⚠️ This page may combine multiple inventors who share the name “TOMITA HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
21 patentsUS6593841B1Jul 15, 2003
Planar magnetic element
TOSHIBA KK159 citations99
US6404317B1Jun 11, 2002
Planar magnetic element
TOSHIBA KK117 citations99
US5801521ASep 1, 1998
Planar magnetic element
TOSHIBA KK108 citations99
US5583474ADec 10, 1996
Planar magnetic element
TOSHIBA KK218 citations99
US6853520B2Feb 8, 2005
Magnetoresistance effect element
TOSHIBA KK67 citations98
US6431185B1Aug 13, 2002
Apparatus and method for cleaning a semiconductor substrate
TOSHIBA KK60 citations96
US6185472B1Feb 6, 2001
Semiconductor device manufacturing method, manufacturing apparatus, simulation method and simulator
TOSHIBA KK76 citations95
US7749909B2Jul 6, 2010
Method of treating a semiconductor substrate
TOSHIBA KK46 citations94
US6436723B1Aug 20, 2002
Etching method and etching apparatus method for manufacturing semiconductor device and semiconductor device
TOSHIBA KK34 citations93
US6207303B1Mar 27, 2001
Multilayered magnetic film having buffer layer inserted between resin layer and laminated magnetic film layer and thin film inductor using the same
TOSHIBA KK46 citations93
US5959329ASep 28, 1999
Insulating oxide film formed by high-temperature wet oxidation
TOSHIBA KK24 citations93
US5522946AJun 4, 1996
Amorphous magnetic thin film and plane magnetic element using same
TOSHIBA KK47 citations93
US7838425B2Nov 23, 2010
Method of treating surface of semiconductor substrate
TOSHIBA KK27 citations92
US7476414B2Jan 13, 2009
Magnetoresistance effect element
TOSHIBA KK14 citations92
US6492271B1Dec 10, 2002
Semiconductor device and method of manufacturing the same
TOSHIBA KK27 citations92
US6286524B1Sep 11, 2001
Wafer drying apparatus and method with residual particle removability enhancement
TOSHIBA KK46 citations92
US6054373AApr 25, 2000
Method of and apparatus for removing metallic impurities diffused in a semiconductor substrate
TOSHIBA KK24 citations92
US6001461ADec 14, 1999
Electronic parts and manufacturing method thereof
TOSHIBA KK44 citations92
US5757063AMay 26, 1998
Semiconductor device having an extrinsic gettering film
TOSHIBA KK47 citations92
US5709958AJan 20, 1998
Electronic parts
TOSHIBA KK48 citations92
US7985683B2Jul 26, 2011
Method of treating a semiconductor substrate
TOSHIBA KK13 citations91
HITACHI LTD
5 patentsUS5771380AJun 23, 1998
Method for information retrieval with scaled down images
HITACHI LTD308 citations99
US6363395B1Mar 26, 2002
Method and system for browsing data on a storage device
HITACHI LTD49 citations96
US5539909AJul 23, 1996
Negotiation method for calling procedures located within other objects without knowledge of their calling syntax
HITACHI LTD99 citations96
US6169547B1Jan 2, 2001
Method for displaying an icon of media data
HITACHI LTD20 citations92
US5586316ADec 17, 1996
System and method for information retrieval with scaled down image
HITACHI LTD34 citations92
TAKATA CORP
5 patentsUS7407193B2Aug 5, 2008
Seat belt buckle
TAKATA CORP46 citations92
US6739625B2May 25, 2004
Seat-belt guide anchor
TAKATA CORP20 citations92
US5630620AMay 20, 1997
Reinforced thermoplastic resin film air bag
TAKATA CORP48 citations92
US5524926AJun 11, 1996
Air bag for protecting an occupant
TAKATA CORP26 citations92
US8371613B2Feb 12, 2013
Pretensioner, seatbelt retractor including the pretensioner, and seatbelt apparatus including the seatbelt retractor
TAKATA CORP25 citations91
TOKYO ELECTRON LTD
4 patentsUS7652276B2Jan 26, 2010
Defect inspection method, defect inspection apparatus having a mounting table with a substrate thereon and an image pickup device are relatively moved for capturing the image of the substrate, and computer readable storage medium storing a program for performing the method
TOKYO ELECTRON LTD23 citations93
US7780366B2Aug 24, 2010
Resist pattern forming method
TOKYO ELECTRON LTD22 citations92
US7488127B2Feb 10, 2009
Resist pattern forming apparatus and method thereof
TOKYO ELECTRON LTD16 citations92
US6984477B2Jan 10, 2006
Resist pattern forming apparatus and method thereof
TOKYO ELECTRON LTD25 citations92
KONICA MINOLTA SYSTEMS LAB INC
3 patentsUS7766241B2Aug 3, 2010
Barcode for two-way verification of a document
KONICA MINOLTA SYSTEMS LAB INC25 citations93
US7523865B2Apr 28, 2009
High resolution barcode and document including verification features
KONICA MINOLTA SYSTEMS LAB INC25 citations93
US7533817B2May 19, 2009
Color barcode producing method and apparatus, color barcode reading method and apparatus and color barcode reproducing method and apparatus
KONICA MINOLTA SYSTEMS LAB INC26 citations92
EBARA CORP
3 patentsTEIJIN LTD
2 patentsAISIN AW CO
1 patentOMRON TATEISI ELECTRONICS CO
1 patentTOYOTA MOTOR CO LTD
1 patentMINOLTA CO LTD
1 patentGEO SEARCH CO LTD
1 patentMINOLTA CAMERA KK
1 patentSANSHIN KOGYO KK
1 patentShowing the top 50 of 249 patents by PatentIndex Score.