Inventor
JI JOON-SU
KR9 patents
Patents
9 patentsUS6909297B2Jun 21, 2005
Probe card
SAMSUNG ELECTRONICS CO LTD62 citations93
US6571448B2Jun 3, 2003
Apparatus for attaching sand papers on dummy wafers
SAMSUNG ELECTRONICS CO LTD7 citations72
US9696402B2Jul 4, 2017
Probe card inspection apparatus
SAMSUNG ELECTRONICS CO LTD5 citations71
US6813804B2Nov 9, 2004
Apparatus and method for cleaning probe card contacts
SAMSUNG ELECTRONICS CO LTD7 citations68
US11067658B2Jul 20, 2021
Probe card inspection wafer, probe card inspection system, and method of inspecting probe card
SAMSUNG ELECTRONICS CO LTD2 citations63
US7423443B2Sep 9, 2008
Method of performing parallel test on semiconductor devices by dividing voltage supply unit
SAMSUNG ELECTRONICS CO LTD3 citations61
US6906341B2Jun 14, 2005
Probe needle test apparatus and method
SAMSUNG ELECTRONICS CO LTD4 citations59
US7622940B2Nov 24, 2009
Semiconductor device having contact failure detector
SAMSUNG ELECTRONICS CO LTD6 citations56
US7626413B2Dec 1, 2009
Parallel testing of semiconductor devices using a dividing voltage supply unit
SAMSUNG ELECTRONICS CO LTD1 citations50