Inventor
SHORE MICHAEL
US18 patents
⚠️ This page may combine multiple inventors who share the name “SHORE MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
14 patentsUS6365421B2Apr 2, 2002
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC118 citations98
US6194738B1Feb 27, 2001
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC102 citations97
US6190972B1Feb 20, 2001
Method for storing information in a semiconductor device
MICRON TECHNOLOGY INC55 citations96
US5895962AApr 20, 1999
Structure and a method for storing information in a semiconductor device
MICRON TECHNOLOGY INC69 citations96
US7593272B2Sep 22, 2009
Detection of row-to-row shorts and other row decode defects in memory devices
MICRON TECHNOLOGY INC18 citations92
US7307896B2Dec 11, 2007
Detection of row-to-row shorts and other row decode defects in memory devices
MICRON TECHNOLOGY INC19 citations92
US6947346B2Sep 20, 2005
Reducing digit equilibrate current during self-refresh mode
MICRON TECHNOLOGY INC17 citations92
US6711093B1Mar 23, 2004
Reducing digit equilibrate current during self-refresh mode
MICRON TECHNOLOGY INC15 citations92
US6104650AAug 15, 2000
Sacrifice read test mode
MICRON TECHNOLOGY INC18 citations92
US7251173B2Jul 31, 2007
Combination column redundancy system for a memory array
MICRON TECHNOLOGY INC29 citations89
US6781901B2Aug 24, 2004
Sacrifice read test mode
MICRON TECHNOLOGY INC5 citations73
US6405324B2Jun 11, 2002
Circuit and method for masking a dormant memory cell
MICRON TECHNOLOGY INC8 citations73
US6691247B2Feb 10, 2004
Circuit and method for masking a dormant memory cell
MICRON TECHNOLOGY INC3 citations62
US6552940B1Apr 22, 2003
Sacrifice read test mode
MICRON TECHNOLOGY INC4 citations62