Inventor · disambiguated record
Ho-Min Son
Also filed as: SON HO-MIN
7 granted patents·4 pending applications·32 citations·filing 2003–2011
78Inventor score
Top patents by PatentIndex Score
11 records- 0175US7037785B2Method of manufacturing flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted May 2, 2006·26 cites·12 claims
- 0266US8497545B2Method of forming nonvolatile memory device having floating gate and related deviceJEE JUNG-GEUN·Filed 2011·Granted Jul 30, 2013·2 cites·12 claims
- 0362US7888204B2Method of forming nonvolatile memory device having floating gate and related deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Feb 15, 2011·2 cites·16 claims
- 0461US7855117B2Method of forming a thin layer and method of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 21, 2010·2 cites·18 claims
- 0543US2008044981A1Trench Isolation Methods, Methods of Forming Gate Structures Using the Trench Isolation Methods and Methods of Fabricating Non-Volatile Memory Devices Using the Trench Isolation MethodsSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0643US2008014753A1Method of Manufacturing a Semiconductor Device Using a Radical Oxidation ProcessJANG WON-JUN·Filed 2007·Application pending·0 cites
- 0740US2008014729A1Method of manufacturing a memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0839US8431983B2Non-volatile memory device and method of fabricating the sameLEE WOONG·Filed 2009·Granted Apr 30, 2013·0 cites·9 claims
- 0938US2008093657A1Nonvolatile memory devices and methods of fabricating the sameSON HO-MIN·Filed 2007·Application pending·0 cites
- 1037US7179707B2Method of forming gate electrode in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Feb 20, 2007·0 cites·8 claims
- 1136US7030036B2Method of forming oxide layer in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Apr 18, 2006·0 cites·20 claims
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