P

Inventor

KUGIMIYA TOSHIHIRO

JP50 patents
⚠️ This page may combine multiple inventors who share the name “KUGIMIYA TOSHIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KOBE STEEL LTD

30 patents
US7365810B2Apr 29, 2008

Display device and method for production thereof

KOBE STEEL LTD74 citations98
US7262085B2Aug 28, 2007

Display device

KOBE STEEL LTD59 citations98
US7098539B2Aug 29, 2006

Electronic device, method of manufacture of the same, and sputtering target

KOBE STEEL LTD67 citations98
US7411298B2Aug 12, 2008

Source/drain electrodes, thin-film transistor substrates, manufacture methods thereof, and display devices

KOBE STEEL LTD59 citations97
US7154180B2Dec 26, 2006

Electronic device, method of manufacture of the same, and sputtering target

KOBE STEEL LTD52 citations96
US7683370B2Mar 23, 2010

Source/drain electrodes, transistor substrates and manufacture methods, thereof, and display devices

KOBE STEEL LTD44 citations93
US7622809B2Nov 24, 2009

Display device and sputtering target for producing the same

KOBE STEEL LTD32 citations92
US7553754B2Jun 30, 2009

Electronic device, method of manufacture of the same, and sputtering target

KOBE STEEL LTD22 citations92
US8350303B2Jan 8, 2013

Display device and sputtering target for producing the same

KOBE STEEL LTD6 citations84
US7897025B2Mar 1, 2011

Method and apparatus for forming thin film

KOBE STEEL LTD11 citations84
US9202926B2Dec 1, 2015

Thin film transistor

KOBE STEEL LTD9 citations82
US7803238B2Sep 28, 2010

Al—Ni-rare earth element alloy sputtering target

KOBE STEEL LTD8 citations81
US9362313B2Jun 7, 2016

Thin film transistor and display device

KOBE STEEL LTD6 citations73
US9318507B2Apr 19, 2016

Thin film transistor and display device

KOBE STEEL LTD4 citations73
US10090208B2Oct 2, 2018

Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation method

KOBE STEEL LTD6 citations72
US9343586B2May 17, 2016

Thin film transistor

KOBE STEEL LTD5 citations72
US9324882B2Apr 26, 2016

Thin film transistor

KOBE STEEL LTD4 citations72
US7952123B2May 31, 2011

Thin film transistor substrate and display device

KOBE STEEL LTD3 citations63
US9508856B2Nov 29, 2016

Thin film transistor

KOBE STEEL LTD2 citations62
US10256091B2Apr 9, 2019

Oxide for semiconductor layer of thin-film transistor, semiconductor layer of thin-film transistor having said oxide, and thin-film transistor

KOBE STEEL LTD0 citations52
US9816944B2Nov 14, 2017

Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation method

KOBE STEEL LTD1 citations52
US9780005B2Oct 3, 2017

Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film

KOBE STEEL LTD0 citations52
US9449990B2Sep 20, 2016

Thin film transistor and display device

KOBE STEEL LTD1 citations52
US7928575B2Apr 19, 2011

Electronic device, method of manufacture of the same, and sputtering target

KOBE STEEL LTD0 citations52
US7459187B2Dec 2, 2008

Surface-treatment method and equipment

KOBE STEEL LTD1 citations52
US10566457B2Feb 18, 2020

Thin film transistor and display device

KOBE STEEL LTD0 citations51
US9647126B2May 9, 2017

Oxide for semiconductor layer in thin film transistor, thin film transistor, display device, and sputtering target

KOBE STEEL LTD0 citations51
US9316589B2Apr 19, 2016

Method for evaluating oxide semiconductor thin film, and method for quality control of oxide semiconductor thin film

KOBE STEEL LTD0 citations51
US9660103B2May 23, 2017

Thin film transistor and method for manufacturing same

KOBE STEEL LTD0 citations48
US10475711B2Nov 12, 2019

Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing quality

KOBE STEEL LTD0 citations41

MIKI AYA

4 patents

MORITA SHINYA

3 patents

OKUNO HIROYUKI

3 patents

SAMSUNG DISPLAY CO LTD

2 patents

MAEDA TAKEAKI

2 patents

GOTO HIROSHI

1 patent

GOTOH HIROSHI

1 patent

PARK JAE WOO

1 patent

EHIRA MASAYA

1 patent

KUGIMIYA TOSHIHIRO

1 patent

AHN BYUNG DU

1 patent