Inventor
BETTADA VIJAY M
US7 patents
Patents
7 patentsUS9892802B1Feb 13, 2018
Hardware assisted scheme for testing memories using scan
APPLE INC3 citations68
US12216161B2Feb 4, 2025
Scan chain analysis using predefined capture signature
APPLE INC0 citations59
US9234942B2Jan 12, 2016
Transition fault testing of source synchronous interface
APPLE INC2 citations55
US10859628B2Dec 8, 2020
Power droop measurements using analog-to-digital converter during testing
APPLE INC0 citations50
US9658634B2May 23, 2017
Under voltage detection and performance throttling
APPLE INC1 citations50
US10026499B2Jul 17, 2018
Memory testing system
APPLE INC0 citations47
US9514842B2Dec 6, 2016
Memory testing system
APPLE INC0 citations47