Inventor
SCHNEIDER CRAIG E
US13 patents
⚠️ This page may combine multiple inventors who share the name “SCHNEIDER CRAIG E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
7 patentsUS6922600B1Jul 26, 2005
System and method for optimizing manufacturing processes using real time partitioned process capability analysis
IBM31 citations91
US6965808B1Nov 15, 2005
System and method for optimizing metrology sampling in APC applications
IBM12 citations83
US6557163B1Apr 29, 2003
Method of photolithographic critical dimension control by using reticle measurements in a control algorithm
IBM14 citations83
US6674516B2Jan 6, 2004
Method of photolithographic exposure dose control as a function of resist sensitivity
IBM4 citations60
US6856378B2Feb 15, 2005
Method of photolithographic exposure dose control as a function of resist sensitivity
IBM0 citations49
US9576863B2Feb 21, 2017
Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness
IBM0 citations46
US9330988B1May 3, 2016
Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness
IBM1 citations46
MICRON TECHNOLOGY INC
6 patentsUS5627785AMay 6, 1997
Memory device with a sense amplifier
MICRON TECHNOLOGY INC173 citations97
US6058058AMay 2, 2000
Memory device with a sense amplifier
MICRON TECHNOLOGY INC4 citations72
US5744978AApr 28, 1998
Variable load device responsive to a circuit parameter
MICRON TECHNOLOGY INC6 citations72
US6172924B1Jan 9, 2001
Memory device with a sense amplifier
MICRON TECHNOLOGY INC3 citations61
US5940338AAug 17, 1999
Memory device with a sense amplifier
MICRON TECHNOLOGY INC1 citations61
US5901099AMay 4, 1999
Memory device with a sense amplifier
MICRON TECHNOLOGY INC4 citations61