P

Inventor

SCHOENMAKERS REMCO

NL18 patents
⚠️ This page may combine multiple inventors who share the name “SCHOENMAKERS REMCO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FEI CO

17 patents
US8912491B2Dec 16, 2014

Method of performing tomographic imaging of a sample in a charged-particle microscope

FEI CO7 citations82
US9147551B2Sep 29, 2015

Method for electron tomography

FEI CO10 citations81
US11488800B2Nov 1, 2022

Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging

FEI CO2 citations71
US10937625B2Mar 2, 2021

Method of imaging a sample using an electron microscope

FEI CO4 citations70
US9934936B2Apr 3, 2018

Charged particle microscope with special aperture plate

FEI CO4 citations69
US12175648B2Dec 24, 2024

Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method

FEI CO2 citations66
US12548732B2Feb 10, 2026

Application management for charged particle microscope devices

FEI CO0 citations61
US12136532B2Nov 5, 2024

Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging

FEI CO0 citations61
US10903043B2Jan 26, 2021

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

FEI CO0 citations61
US11861817B2Jan 2, 2024

Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method

FEI CO0 citations59
US11100612B2Aug 24, 2021

Acquisition strategy for neural network based image restoration

FEI CO0 citations59
US11482400B2Oct 25, 2022

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

FEI CO0 citations57
US11417497B2Aug 16, 2022

Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired

FEI CO0 citations56
US11901155B2Feb 13, 2024

Method of aligning a charged particle beam apparatus

FEI CO0 citations54
US9618460B2Apr 11, 2017

Method of performing tomographic imaging of a sample in a charged-particle microscope

FEI CO1 citations48
US10593068B2Mar 17, 2020

Tomographic imaging method

FEI CO0 citations38
US10481378B2Nov 19, 2019

Interactive graphical representation of image quality and control thereof

FEI CO0 citations38

LUECKEN UWE

1 patent