Inventor

LEU IYUN

TW18 patents

⚠️ This page may combine multiple inventors who share the name “LEU IYUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEU IYUN

ELITE SEMICONDUCTOR INC

Smart defect calibration system and the method thereof

Method and system for intelligent defect classification and sampling, and non-transitory computer-readable storage device

Smart coordinate conversion and calibration system in semiconductor wafer manufacturing

Smart coordinate conversion and calibration system in semiconductor wafer manufacturing

Smart defect calibration system in semiconductor wafer manufacturing

Method for performing smart semiconductor wafer defect calibration

Method for smart conversion and calibration of coordinate

Method for smart conversion and calibration of coordinate

Semiconductor Fab&#39;s defect operating system and method thereof

Method and system for quickly diagnosing, classifying, and sampling in-line defects based on CAA pre-diagnosis database

Intelligent CAA failure pre-diagnosis method and system for design layout

LEU IYUN

Intelligent defect diagnosis method

Method for smart defect screen and sample

Integrated interfacing system and method for intelligent defect yield solutions

Method for building rule of thumb of defect classification, and methods for classifying defect and judging killer defect based on rule of thumb and critical area analysis

Method for utilizing fabrication defect of an article

Method for defect diagnosis and management

ELITETECH TECH CO LTD

Method and system for intelligent weak pattern diagnosis, and non-transitory computer-readable storage medium

Semiconductor Fab's defect operating system and method thereof