Inventor

KNIPPELMEYER RAINER

US36 patents

⚠️ This page may combine multiple inventors who share the name “KNIPPELMEYER RAINER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KNIPPELMEYER RAINER

ZEISS CARL MICROSCOPY GMBH

Objective lens arrangement usable in particle-optical systems

Charged particle beam system and method of operating the same

Charged particle inspection method and charged particle system

Charged particle multi-beam inspection system and method of operating the same

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

Charged particle inspection method and charged particle system

Charged particle beam system and method of operating the same

Objective lens arrangement usable in particle-optical systems

ZEISS CARL NTS GMBH

Detector arrangement and detection method

Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor

Electron microscopy system

Particle-optical apparatus and method for operating the same

Applications operating with beams of charged particles

Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system

Electron microscopy system and electron microscopy method

Particle-optical apparatus, electron microscopy system and electron lithography system

KLA TENCOR CORP

Method and system for charged particle microscopy with improved image beam stabilization and interrogation

Method and system for focus adjustment of a multi-beam scanning electron microscopy system

Multi-beam dark field imaging

Backscattered electrons (BSE) imaging using multi-beam tools

Method and system for noise mitigation in a multi-beam scanning electron microscopy system

Method and system for charged particle microscopy with improved image beam stabilization and interrogation

Field curvature correction for multi-beam inspection systems

Method and system for focus adjustment of a multi-beam scanning electron microscopy system

KNIPPELMEYER RAINER

Charged particle detection system and multi-beamlet inspection system

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

Repairing defects

Reducing particle implantation

APPLIED MATERIALS ISRAEL

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

CARL ZEISS SMT A G

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

ZEISS CARL SMT GMBH

Charged particle-optical systems, methods and components

ZEISS CARL SMT AG

Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same

ZEISS CARL NTS LLC

Cross-section systems and methods