P

Inventor

DEGRENNE NICOLAS

FR14 patents

Patents

14 patents
US11169201B2Nov 9, 2021

Diagnostic device and method to establish degradation state of electrical connection in power semiconductor device

MITSUBISHI ELECTRIC CORP9 citations81
US10705133B2Jul 7, 2020

Method and device for estimating level of damage or lifetime expectation of power semiconductor module

MITSUBISHI ELECTRIC CORP6 citations71
US10622281B2Apr 14, 2020

Power module and method for manufacturing power module

MITSUBISHI ELECTRIC CORP2 citations71
US11474146B2Oct 18, 2022

Method for estimating degradation of a wire-bonded power semi-conductor module

MITSUBISHI ELECTRIC CORP4 citations67
US11378612B2Jul 5, 2022

Device and method for monitoring the health of a power semiconductor die

MITSUBISHI ELECTRIC CORP0 citations61
US10782338B2Sep 22, 2020

Method and device for estimating level of damage or lifetime expectation of power semiconductor module

MITSUBISHI ELECTRIC CORP1 citations61
US12013428B2Jun 18, 2024

Method and device for monitoring gate signal of power semiconductor

MITSUBISHI ELECTRIC CORP0 citations59
US12270715B2Apr 8, 2025

Method for estimating parameters of a junction of a power semi-conductor element and power unit

MITSUBISHI ELECTRIC CORP0 citations51
US10827619B2Nov 3, 2020

Printed circuit board and method for manufacturing printed circuit board

MITSUBISHI ELECTRIC CORP0 citations51
US10495681B2Dec 3, 2019

System and method for determining if deterioration occurs in interface of semiconductor die of electric power module

MITSUBISHI ELECTRIC CORP0 citations51
US11927619B2Mar 12, 2024

Power semi-conductor module, mask, measurement method, computer software, and recording medium

MITSUBISHI ELECTRIC CORP0 citations50
US11217378B2Jan 4, 2022

Inductive assembly and method of manufacturing inductive assembly

MITSUBISHI ELECTRIC CORP0 citations50
US11152934B2Oct 19, 2021

Device and method for controlling switching

MITSUBISHI ELECTRIC CORP0 citations50
US10732617B2Aug 4, 2020

Method, device and system for estimating level of damage of electric device using histograms

MITSUBISHI ELECTRIC CORP0 citations41