Inventor

CHEONG LIN LEE

US16 patents

⚠️ This page may combine multiple inventors who share the name “CHEONG LIN LEE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PDF SOLUTIONS INC

9 patents

US11295993B2Apr 5, 2022

Selective inclusion/exclusion of semiconductor chips in accelerated failure tests

PDF SOLUTIONS INC1 citations59

US11775714B2Oct 3, 2023

Rational decision-making tool for semiconductor processes

PDF SOLUTIONS INC0 citations57

US11022642B2Jun 1, 2021

Semiconductor yield prediction

PDF SOLUTIONS INC0 citations51

US11609812B2Mar 21, 2023

Anomalous equipment trace detection and classification

PDF SOLUTIONS INC0 citations50

US12038802B2Jul 16, 2024

Collaborative learning model for semiconductor applications

PDF SOLUTIONS INC0 citations47

ASML NETHERLANDS BV

4 patents

US11443083B2Sep 13, 2022

Identification of hot spots or defects by machine learning

ASML NETHERLANDS BV2 citations73

US11126092B2Sep 21, 2021

Methods for determining an approximate value of a processing parameter at which a characteristic of the patterning process has a target value

ASML NETHERLANDS BV3 citations70

US12360461B2Jul 15, 2025

Identification of hot spots or defects by machine learning

ASML NETHERLANDS BV0 citations62

US11403453B2Aug 2, 2022

Defect prediction

ASML NETHERLANDS BV0 citations59

AMAZON TECH INC

3 patents

US12124440B1Oct 22, 2024

Converting natural language queries to SQL queries using ontological codes and placeholders

AMAZON TECH INC4 citations66

US12505288B1Dec 23, 2025

Multi-machine learning system for interacting with a large language model

AMAZON TECH INC1 citations59

US12353837B1Jul 8, 2025

Customizable framework for natural language processing explainability

AMAZON TECH INC0 citations47

CHEONG LIN LEE

PDF SOLUTIONS INC

Maintenance scheduling for semiconductor manufacturing equipment

Failure detection and classsification using sensor data and/or measurement data

Wafer bin map based root cause analysis

Wafer bin map based root cause analysis

Selective inclusion/exclusion of semiconductor chips in accelerated failure tests

Rational decision-making tool for semiconductor processes

Semiconductor yield prediction

Anomalous equipment trace detection and classification

Collaborative learning model for semiconductor applications

ASML NETHERLANDS BV

Identification of hot spots or defects by machine learning

Methods for determining an approximate value of a processing parameter at which a characteristic of the patterning process has a target value

Identification of hot spots or defects by machine learning

Defect prediction

AMAZON TECH INC

Converting natural language queries to SQL queries using ontological codes and placeholders

Multi-machine learning system for interacting with a large language model

Customizable framework for natural language processing explainability