Inventor · disambiguated record
Ahmet Tokuz
Also filed as: TOKUZ AHMET
5 granted patents·6 citations·filing 2010–2023
69Inventor score
Top patents by PatentIndex Score
5 records- 0188US12099091B2Cost-saving scheme for scan testing of 3D stack dieADVANCED MICRO DEVICES INC·Filed 2022·Granted Sep 24, 2024·2 cites·20 claims
- 0281US11181579B2Performing scan data transfer inside multi-die package with SERDES functionalityADVANCED MICRO DEVICES INC·Filed 2019·Granted Nov 23, 2021·4 cites·27 claims
- 0373US12216162B2Performing scan data transfer inside multi-die package with serdes functionalityADVANCED MICRO DEVICES INC·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 0464US11762017B2Performing scan data transfer inside multi-die package with SERDES functionalityADVANCED MICRO DEVICES INC·Filed 2021·Granted Sep 19, 2023·0 cites·20 claims
- 0527US8707117B2Methods and apparatus to test multi clock domain data paths with a shared capture clock signalSHTULMAN ARI·Filed 2010·Granted Apr 22, 2014·0 cites·18 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →