P

Inventor

CHA RANDALL CHER LIANG

SG28 patents
⚠️ This page may combine multiple inventors who share the name “CHA RANDALL CHER LIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

22 patents
US6348385B1Feb 19, 2002

Method for a short channel CMOS transistor with small overlay capacitance using in-situ doped spacers with a low dielectric constant

CHARTERED SEMICONDUCTOR MFG128 citations97
US6613652B2Sep 2, 2003

Method for fabricating SOI devices with option of incorporating air-gap feature for better insulation and performance

CHARTERED SEMICONDUCTOR MFG28 citations92
US6387784B1May 14, 2002

Method to reduce polysilicon depletion in MOS transistors

CHARTERED SEMICONDUCTOR MFG22 citations92
US6376360B1Apr 23, 2002

Effective retardation of fluorine radical attack on metal lines via use of silicon rich oxide spacers

CHARTERED SEMICONDUCTOR MFG20 citations92
US6355563B1Mar 12, 2002

Versatile copper-wiring layout design with low-k dielectric integration

CHARTERED SEMICONDUCTOR MFG46 citations92
US6319767B1Nov 20, 2001

Method to eliminate top metal corner shaping during bottom metal patterning for MIM capacitors via plasma ashing and hard masking technique

CHARTERED SEMICONDUCTOR MFG50 citations92
US6468851B1Oct 22, 2002

Method of fabricating CMOS device with dual gate electrode

CHARTERED SEMICONDUCTOR MFG55 citations91
US6284610B1Sep 4, 2001

Method to reduce compressive stress in the silicon substrate during silicidation

CHARTERED SEMICONDUCTOR MFG19 citations91
US6284590B1Sep 4, 2001

Method to eliminate top metal corner shaping during bottom metal patterning for MIM capacitors

CHARTERED SEMICONDUCTOR MFG29 citations91
US6841441B2Jan 11, 2005

Method to produce dual gates (one metal and one poly or metal silicide) for CMOS devices using sputtered metal deposition, metallic ion implantation, or silicon implantation, and laser annealing

CHARTERED SEMICONDUCTOR MFG12 citations84
US6664153B2Dec 16, 2003

Method to fabricate a single gate with dual work-functions

CHARTERED SEMICONDUCTOR MFG18 citations84
US6610575B1Aug 26, 2003

Forming dual gate oxide thickness on vertical transistors by ion implantation

CHARTERED SEMICONDUCTOR MFG16 citations84
US6468880B1Oct 22, 2002

Method for fabricating complementary silicon on insulator devices using wafer bonding

CHARTERED SEMICONDUCTOR MFG14 citations84
US6849928B2Feb 1, 2005

Dual silicon-on-insulator device wafer die

CHARTERED SEMICONDUCTOR MFG6 citations74
US6432797B1Aug 13, 2002

Simplified method to reduce or eliminate STI oxide divots

CHARTERED SEMICONDUCTOR MFG13 citations74
US6384437B1May 7, 2002

Low-leakage DRAM structures using selective silicon epitaxial growth (SEG) on an insulating layer

CHARTERED SEMICONDUCTOR MFG9 citations74
US6319772B1Nov 20, 2001

Method for making low-leakage DRAM structures using selective silicon epitaxial growth (SEG) on an insulating layer

CHARTERED SEMICONDUCTOR MFG14 citations74
US6780691B2Aug 24, 2004

Method to fabricate elevated source/drain transistor with large area for silicidation

CHARTERED SEMICONDUCTOR MFG12 citations73
US6727151B2Apr 27, 2004

Method to fabricate elevated source/drain structures in MOS transistors

CHARTERED SEMICONDUCTOR MFG3 citations63
US6399471B1Jun 4, 2002

Assorted aluminum wiring design to enhance chip-level performance for deep sub-micron application

CHARTERED SEMICONDUCTOR MFG4 citations62
US6878623B2Apr 12, 2005

Technique to achieve thick silicide film for ultra-shallow junctions

CHARTERED SEMICONDUCTOR MFG3 citations61
US6472697B2Oct 29, 2002

Assorted aluminum wiring design to enhance chip-level performance for deep sub-micron application

CHARTERED SEMICONDUCTOR MFG0 citations52

CHESTNUT SPRINGS LLC

3 patents

CHARTERED SEMICONDUCTORS MAUFA

1 patent

CHARTERED SEMICONDUCTOR MANFAC

1 patent

LIM YEOW KHENG

1 patent