P

Inventor

KOHARA HIDEKATSU

JP56 patents
⚠️ This page may combine multiple inventors who share the name “KOHARA HIDEKATSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO OHKA KOGYO CO LTD

49 patents
US4833067AMay 23, 1989

Developing solution for positive-working photoresist comprising tmah and non-ionic surfactant

TOKYO OHKA KOGYO CO LTD75 citations96
US4740451AApr 26, 1988

Photosensitive compositions and a method of patterning using the same

TOKYO OHKA KOGYO CO LTD73 citations96
US4873177AOct 10, 1989

Method for forming a resist pattern on a substrate surface and a scum-remover therefor

TOKYO OHKA KOGYO CO LTD31 citations93
US5601961AFeb 11, 1997

High-sensitivity positive-working photoresist composition

TOKYO OHKA KOGYO CO LTD24 citations92
US4784937ANov 15, 1988

Developing solution for positive-working photoresist comprising a metal ion free organic base and an anionic surfactant

TOKYO OHKA KOGYO CO LTD35 citations92
US4731319AMar 15, 1988

Positive-working naphthoquinone diazide photoresist composition with two cresol novolac resins

TOKYO OHKA KOGYO CO LTD48 citations92
US6517993B2Feb 11, 2003

Copolymer, photoresist composition, and process for forming resist pattern with high aspect ratio

TOKYO OHKA KOGYO CO LTD25 citations90
US4820621AApr 11, 1989

Developer solution for positive-working photoresist compositions comprising a base and a non-ionic surfactant

TOKYO OHKA KOGYO CO LTD40 citations90
US5057397AOct 15, 1991

Electron beam-curable resist composition and method for fine patterning using the same

TOKYO OHKA KOGYO CO LTD20 citations81
US4882260ANov 21, 1989

Positive-working photosensitive quinone diazide composition with alkali insoluble dye and alkali soluble dye

TOKYO OHKA KOGYO CO LTD19 citations81
US6296992B1Oct 2, 2001

Positive photoresist composition and process for forming contact hole

TOKYO OHKA KOGYO CO LTD6 citations74
US6177226B1Jan 23, 2001

Positive photoresist composition and process for forming contact hole

TOKYO OHKA KOGYO CO LTD7 citations74
US6030741AFeb 29, 2000

Positive resist composition

TOKYO OHKA KOGYO CO LTD8 citations74
US5518860AMay 21, 1996

Positive-working quinonediazide photoresist composition containing hydroxyalkyl substituted pyridine compound

TOKYO OHKA KOGYO CO LTD13 citations74
US5498514AMar 12, 1996

Lithographic double-coated patterning plate with undercoat levelling layer

TOKYO OHKA KOGYO CO LTD13 citations74
US5401617AMar 28, 1995

Method for forming positive patterned resist layer on tantalum substrate utilizing quinone diazide composition with aromatic hydroxy additive

TOKYO OHKA KOGYO CO LTD6 citations74
US4985333AJan 15, 1991

Positive-working photosensitive composition with three difference 1,2-naphthoquinone diazide sulfonic acid esters to include the ester of curcumin

TOKYO OHKA KOGYO CO LTD8 citations74
US4804612AFeb 14, 1989

Highly heat-resistant positive-working o-quinone diazide containing photoresist composition with novolac resin made from phenol with ethylenic unsaturation

TOKYO OHKA KOGYO CO LTD17 citations74
US6492085B1Dec 10, 2002

Positive photoresist composition and process and synthesizing polyphenol compound

TOKYO OHKA KOGYO CO LTD10 citations73
US6379859B2Apr 30, 2002

Positive photoresist composition and process for forming resist pattern using same

TOKYO OHKA KOGYO CO LTD12 citations73
US6120969ASep 19, 2000

Polyphenol compound, quinonediazide ester and positive photoresist composition

TOKYO OHKA KOGYO CO LTD14 citations73
US5738968AApr 14, 1998

Positive photoresist composition

TOKYO OHKA KOGYO CO LTD8 citations73
US5604077AFeb 18, 1997

Positive-working photoresist composition comprising a novolac resin made in butyrolactone as a solvent

TOKYO OHKA KOGYO CO LTD11 citations73
US5384228AJan 24, 1995

Alkali-developable positive-working photosensitive resin composition

TOKYO OHKA KOGYO CO LTD8 citations73
US5180653AJan 19, 1993

Electron beam-curable resist composition and method for fine patterning using the same

TOKYO OHKA KOGYO CO LTD10 citations73
US4906549AMar 6, 1990

Positive-working photoresist composition with quinone diazide sulfonic acid ester and novolac made from m-cresol, p-cresol and aliphatic phenol with 2-6 carbon atoms

TOKYO OHKA KOGYO CO LTD15 citations73
US6187500B1Feb 13, 2001

Positive photoresist compositions and multilayer resist materials using same

TOKYO OHKA KOGYO CO LTD13 citations72
US5853948ADec 29, 1998

Positive photoresist compositions and multilayer resist materials using the same

TOKYO OHKA KOGYO CO LTD15 citations72
US5728504AMar 17, 1998

Positive photoresist compositions and multilayer resist materials using the same

TOKYO OHKA KOGYO CO LTD15 citations72
US5576138ANov 19, 1996

Positive-working naphtho quinone diazide sulfonic acid ester photoresist composition containing select combination of additives

TOKYO OHKA KOGYO CO LTD13 citations72
US5501936AMar 26, 1996

Positive-working quinonediazide photoresist composition containing a cyclohexyl-substituted triphenylmethane compound

TOKYO OHKA KOGYO CO LTD15 citations72
US5478692ADec 26, 1995

Positive-working naphthoquinone diazide sulfonic acid ester photoresist composition containing 4,4'-bis(dialkylamino)benzophenone

TOKYO OHKA KOGYO CO LTD13 citations72
US5434031AJul 18, 1995

Positive-working naphthoquinone diazide photoresist composition containing specific hydroxy compound additive

TOKYO OHKA KOGYO CO LTD16 citations72
US5332647AJul 26, 1994

Positive-working quinone diazide composition containing N,N',N"-substituted isocyanurate compound and associated article

TOKYO OHKA KOGYO CO LTD9 citations72
US5702862ADec 30, 1997

Positive photoresist coating solution comprising a mixed solvent of propylene glycol monopropyl ether and 2-heptanone

TOKYO OHKA KOGYO CO LTD6 citations71
US6566031B1May 20, 2003

Positive photoresist composition, substrate with a photosensitive film and process for imaging a resist pattern

TOKYO OHKA KOGYO CO LTD3 citations63
US6406827B2Jun 18, 2002

Positive photoresist composition and process for forming resist pattern

TOKYO OHKA KOGYO CO LTD4 citations63
US6300033B1Oct 9, 2001

Positive photoresist composition and process for forming resist pattern

TOKYO OHKA KOGYO CO LTD6 citations63
US6207340B1Mar 27, 2001

Positive photoresist composition and process for forming contact hole

TOKYO OHKA KOGYO CO LTD4 citations63
US6106994AAug 22, 2000

Production process of polyphenol diesters, and positive photosensitive compositions

TOKYO OHKA KOGYO CO LTD2 citations63
US5599653AFeb 4, 1997

Pattern forming method with selective silylation utilizing lithographic double-coated patterning plate with undercoat levelling layer

TOKYO OHKA KOGYO CO LTD5 citations63
US6312863B1Nov 6, 2001

Positive photoresist composition

TOKYO OHKA KOGYO CO LTD5 citations62
US6127087AOct 3, 2000

Positive photoresist compositions and multilayer resist materials using same

TOKYO OHKA KOGYO CO LTD5 citations62
US6083657AJul 4, 2000

Positive photoresist compositions and a process for producing the same

TOKYO OHKA KOGYO CO LTD2 citations62
US5702861ADec 30, 1997

Positive photoresist composition

TOKYO OHKA KOGYO CO LTD5 citations62
US5401605AMar 28, 1995

Positive working photosensitive resin composition containing 1,2-naphthoquinone diazide esterification product of triphenylmethane compound

TOKYO OHKA KOGYO CO LTD5 citations62
US5281508AJan 25, 1994

Positive-working photoresist containing o-naphthoquinone diazide sulfonic acid ester and novolak resin consisting of 35 to 43% m-cresol and 65 to 57% p-cresol with substantial absence of o-cresol

TOKYO OHKA KOGYO CO LTD4 citations62
US6475694B2Nov 5, 2002

Positive photoresist composition comprising a phenolic compound having both an acid-decomposable group and a naphthoquinonediazide sulfonyl group

TOKYO OHKA KOGYO CO LTD4 citations61
US6939926B2Sep 6, 2005

Phenol novolak resin, production process thereof, and positive photoresist composition using the same

TOKYO OHKA KOGYO CO LTD2 citations60

TOKYO OHKA KOGYA CO LTD

1 patent

Showing the top 50 of 56 patents by PatentIndex Score.