Inventor
CHEN WANG-JIN
TW4 patents
Patents
4 patentsUS6895540B2May 17, 2005
Mux scan cell with delay circuit for reducing hold-time violations
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US7165232B2Jan 16, 2007
I/O circuit placement method and semiconductor device
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US6978411B2Dec 20, 2005
Memory test system for peak power reduction
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US7394272B2Jul 1, 2008
Built-in self test for system in package
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