Inventor
TOREK KEVIN J
US50 patents
⚠️ This page may combine multiple inventors who share the name “TOREK KEVIN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
43 patentsUS7030034B2Apr 18, 2006
Methods of etching silicon nitride substantially selectively relative to an oxide of aluminum
MICRON TECHNOLOGY INC234 citations99
US6372657B1Apr 16, 2002
Method for selective etching of oxides
MICRON TECHNOLOGY INC188 citations99
US6562726B1May 13, 2003
Acid blend for removing etch residue
MICRON TECHNOLOGY INC117 citations98
US6783695B1Aug 31, 2004
Acid blend for removing etch residue
MICRON TECHNOLOGY INC52 citations96
US6517738B1Feb 11, 2003
Acid blend for removing etch residue
MICRON TECHNOLOGY INC55 citations96
US6453914B2Sep 24, 2002
Acid blend for removing etch residue
MICRON TECHNOLOGY INC63 citations96
US6087273AJul 11, 2000
Process for selectively etching silicon nitride in the presence of silicon oxide
MICRON TECHNOLOGY INC49 citations96
US7378353B2May 27, 2008
High selectivity BPSG to TEOS etchant
MICRON TECHNOLOGY INC23 citations93
US6589884B1Jul 8, 2003
Method of forming an inset in a tungsten silicide layer in a transistor gate stack
MICRON TECHNOLOGY INC46 citations93
US6232232B1May 15, 2001
High selectivity BPSG to TEOS etchant
MICRON TECHNOLOGY INC27 citations93
US6090683AJul 18, 2000
Method of etching thermally grown oxide substantially selectively relative to deposited oxide
MICRON TECHNOLOGY INC29 citations93
US5885903AMar 23, 1999
Process for selectively etching silicon nitride in the presence of silicon oxide
MICRON TECHNOLOGY INC34 citations93
US6758938B1Jul 6, 2004
Delivery of dissolved ozone
MICRON TECHNOLOGY INC30 citations92
US6645874B1Nov 11, 2003
Delivery of dissolved ozone
MICRON TECHNOLOGY INC34 citations92
US6599683B1Jul 29, 2003
Photoresist developer with reduced resist toppling and method of using same
MICRON TECHNOLOGY INC28 citations92
US10714400B2Jul 14, 2020
Methods of forming semiconductor structures comprising thin film transistors including oxide semiconductors
MICRON TECHNOLOGY INC11 citations86
US7329576B2Feb 12, 2008
Double-sided container capacitors using a sacrificial layer
MICRON TECHNOLOGY INC9 citations84
US6541391B2Apr 1, 2003
Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates
MICRON TECHNOLOGY INC13 citations84
US6165853ADec 26, 2000
Trench isolation method
MICRON TECHNOLOGY INC17 citations84
US7678648B2Mar 16, 2010
Subresolution silicon features and methods for forming the same
MICRON TECHNOLOGY INC6 citations74
US7667258B2Feb 23, 2010
Double-sided container capacitors using a sacrificial layer
MICRON TECHNOLOGY INC5 citations74
US6740597B1May 25, 2004
Methods of removing at least some of a material from a semiconductor substrate
MICRON TECHNOLOGY INC6 citations74
US6194286B1Feb 27, 2001
Method of etching thermally grown oxide substantially selectively relative to deposited oxide
MICRON TECHNOLOGY INC11 citations74
US6150277ANov 21, 2000
Method of making an oxide structure having a finely calibrated thickness
MICRON TECHNOLOGY INC5 citations74
US11488981B2Nov 1, 2022
Array of vertical transistors and method used in forming an array of vertical transistors
MICRON TECHNOLOGY INC4 citations73
US11276613B2Mar 15, 2022
Methods of forming semiconductor structures comprising thin film transistors including oxide semiconductors
MICRON TECHNOLOGY INC2 citations73
US6740593B2May 25, 2004
Semiconductor processing methods utilizing low concentrations of reactive etching components
MICRON TECHNOLOGY INC9 citations73
US6709983B2Mar 23, 2004
Semiconductor processing methods utilizing low concentrations of reactive etching components
MICRON TECHNOLOGY INC9 citations73
US6576557B1Jun 10, 2003
Semiconductor processing methods
MICRON TECHNOLOGY INC6 citations73
US9583381B2Feb 28, 2017
Methods for forming semiconductor devices and semiconductor device structures
MICRON TECHNOLOGY INC3 citations72
US9799658B2Oct 24, 2017
Methods of forming capacitors
MICRON TECHNOLOGY INC3 citations71
US12100629B2Sep 24, 2024
Methods of forming transistors and methods of forming devices comprising transistors
MICRON TECHNOLOGY INC0 citations63
US11652108B2May 16, 2023
Integrated assemblies and methods of forming integrated assemblies
MICRON TECHNOLOGY INC0 citations63
US7354863B2Apr 8, 2008
Methods of selectively removing silicon
MICRON TECHNOLOGY INC4 citations63
US7261835B2Aug 28, 2007
Acid blend for removing etch residue
MICRON TECHNOLOGY INC2 citations63
US7205245B2Apr 17, 2007
Method of forming trench isolation within a semiconductor substrate
MICRON TECHNOLOGY INC2 citations63
US6350547B1Feb 26, 2002
Oxide structure having a finely calibrated thickness
MICRON TECHNOLOGY INC5 citations63
US12336288B2Jun 17, 2025
Array of vertical transistors and method used in forming an array of vertical transistors
MICRON TECHNOLOGY INC0 citations62
US7977037B2Jul 12, 2011
Photoresist processing methods
MICRON TECHNOLOGY INC3 citations57
US6977230B2Dec 20, 2005
Methods of removing material from a semiconductor substrate
MICRON TECHNOLOGY INC0 citations52
US9196673B2Nov 24, 2015
Methods of forming capacitors
MICRON TECHNOLOGY INC0 citations50
US11908932B2Feb 20, 2024
Apparatuses comprising vertical transistors having gate electrodes at least partially recessed within channel regions, and related methods and systems
MICRON TECHNOLOGY INC0 citations48
US8889558B2Nov 18, 2014
Methods of forming a pattern on a substrate
MICRON TECHNOLOGY INC1 citations47
TOREK KEVIN J
4 patentsUS8084845B2Dec 27, 2011
Subresolution silicon features and methods for forming the same
TOREK KEVIN J12 citations83
US8981444B2Mar 17, 2015
Subresolution silicon features and methods for forming the same
TOREK KEVIN J1 citations62
US8685625B2Apr 1, 2014
Photoresist processing methods
TOREK KEVIN J0 citations48
US8283112B2Oct 9, 2012
Photoresist processing methods
TOREK KEVIN J0 citations48