Inventor

LEE KANG-YOUL

KR29 patents

⚠️ This page may combine multiple inventors who share the name “LEE KANG-YOUL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEE KANG-YOUL

HYNIX SEMICONDUCTOR INC

Antifuse circuit

Data input circuit for a semiconductor memory capable of adapting to a phase skew between a data strobe signal and an external clock signal

Internal clock driver circuit

Semiconductor memory device for preventing skew and timing error of output data

Counting circuit for controlling an off-chip driver and method of changing an output current value of the off-chip driver using the same

Data writing apparatus and method for semiconductor integrated circuit

Internal clock driver circuit

Ringing masking device having buffer control unit

Synchronous semiconductor memory device and method for driving the same

Power supply circuit for sense amplifier of semiconductor memory device

Pipe latch circuit for increasing data output speed, a semiconductor memory device with the pipe latch circuit and data output operation method of the same

Semiconductor device capable of adjusting operation timing using antifuse

Data output controller for memory device

Data strobe circuit using clock signal

Data output circuit and method

Circuit for outputting data of semiconductor memory apparatus

Counting circuit for controlling an off-chip driver and method of changing and output current value of the off-chip driver using the same

Counter circuit for controlling off-chip driver

SK HYNIX INC

Semiconductor device, semiconductor system including the same and test method thereof

Error detecting circuit and semiconductor apparatus including the same

Latch circuit and flip-flop circuit including the same

Current break circuit, semiconductor device having the same and operating method thereof

Semiconductor device, semiconductor system including the same and test method thereof

LEE KANG-YOUL

Synchronous semiconductor memory device

Memory device and compressive test method for the same

Data output circuit and method

HYUNDAI ELECTRONICS IND

Multi-level bonding option circuit

KIM KWANG-HYUN

Data output circuit of semiconductor memory device

HWANG JEONG TAE

Semiconductor memory apparatus