Inventor
DORIS BRUCE B
US716 patents
⚠️ This page may combine multiple inventors who share the name “DORIS BRUCE B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
48 patentsUS9362355B1Jun 7, 2016
Nanosheet MOSFET with full-height air-gap spacer
IBM198 citations99
US8969934B1Mar 3, 2015
Gate-all-around nanowire MOSFET and method of formation
IBM326 citations99
US7678638B2Mar 16, 2010
Metal gated ultra short MOSFET devices
IBM121 citations99
US7494861B2Feb 24, 2009
Method for metal gated ultra short MOSFET devices
IBM121 citations99
US7459752B2Dec 2, 2008
Ultra thin body fully-depleted SOI MOSFETs
IBM283 citations99
US7348629B2Mar 25, 2008
Metal gated ultra short MOSFET devices
IBM124 citations99
US7329923B2Feb 12, 2008
High-performance CMOS devices on hybrid crystal oriented substrates
IBM138 citations99
US7015082B2Mar 21, 2006
High mobility CMOS circuits
IBM159 citations99
US6977194B2Dec 20, 2005
Structure and method to improve channel mobility by gate electrode stress modification
IBM225 citations99
US6825529B2Nov 30, 2004
Stress inducing spacers
IBM234 citations99
US6717216B1Apr 6, 2004
SOI based field effect transistor having a compressive film in undercut area under the channel and a method of making the device
IBM282 citations99
US9647139B2May 9, 2017
Atomic layer deposition sealing integration for nanosheet complementary metal oxide semiconductor with replacement spacer
IBM34 citations98
US9490335B1Nov 8, 2016
Extra gate device for nanosheet
IBM45 citations98
US9431305B1Aug 30, 2016
Vertical transistor fabrication and devices
IBM57 citations98
US9287135B1Mar 15, 2016
Sidewall image transfer process for fin patterning
IBM67 citations98
US9219154B1Dec 22, 2015
Method of fabricating electrostatically enhanced fins and stacked nanowire field effect transistors
IBM46 citations98
US8900951B1Dec 2, 2014
Gate-all-around nanowire MOSFET and method of formation
IBM38 citations98
US8822320B2Sep 2, 2014
Dense finFET SRAM
IBM38 citations98
US8796093B1Aug 5, 2014
Doping of FinFET structures
IBM71 citations98
US7993999B2Aug 9, 2011
High-K/metal gate CMOS finFET with improved pFET threshold voltage
IBM111 citations98
US7432567B2Oct 7, 2008
Metal gate CMOS with at least a single gate metal and dual gate dielectrics
IBM58 citations98
US7388259B2Jun 17, 2008
Strained finFET CMOS device structures
IBM61 citations98
US7291886B2Nov 6, 2007
Hybrid substrate technology for high-mobility planar and multiple-gate MOSFETs
IBM73 citations98
US7250658B2Jul 31, 2007
Hybrid planar and FinFET CMOS devices
IBM164 citations98
US7224033B2May 29, 2007
Structure and method for manufacturing strained FINFET
IBM110 citations98
US7091566B2Aug 15, 2006
Dual gate FinFet
IBM69 citations98
US6974981B2Dec 13, 2005
Isolation structures for imposing stress patterns
IBM137 citations98
US6939751B2Sep 6, 2005
Method and manufacture of thin silicon on insulator (SOI) with recessed channel
IBM98 citations98
US6911383B2Jun 28, 2005
Hybrid planar and finFET CMOS devices
IBM109 citations98
US6790733B1Sep 14, 2004
Preserving TEOS hard mask using COR for raised source-drain including removable/disposable spacer
IBM122 citations97
US7098477B2Aug 29, 2006
Structure and method of manufacturing a finFET device having stacked fins
IBM62 citations96
US6780694B2Aug 24, 2004
MOS transistor
IBM67 citations96
US6657244B1Dec 2, 2003
Structure and method to reduce silicon substrate consumption and improve gate sheet resistance during silicide formation
IBM55 citations96
US6838695B2Jan 4, 2005
CMOS device structure with improved PFET gate electrode
IBM74 citations95
US9741792B2Aug 22, 2017
Bulk nanosheet with dielectric isolation
IBM24 citations94
US9653547B1May 16, 2017
Integrated etch stop for capped gate and method for manufacturing the same
IBM22 citations94
US9515138B1Dec 6, 2016
Structure and method to minimize junction capacitance in nano sheets
IBM33 citations94
US8653599B1Feb 18, 2014
Strained SiGe nanowire having (111)-oriented sidewalls
IBM39 citations94
US7247912B2Jul 24, 2007
Structures and methods for making strained MOSFETs
IBM74 citations94
US9911592B2Mar 6, 2018
Method for making nanosheet CMOS device integrating atomic layer deposition process and replacement gate structure
IBM13 citations93
US9853132B2Dec 26, 2017
Nanosheet MOSFET with full-height air-gap spacer
IBM17 citations93
US9685539B1Jun 20, 2017
Nanowire isolation scheme to reduce parasitic capacitance
IBM17 citations93
US9508829B1Nov 29, 2016
Nanosheet MOSFET with full-height air-gap spacer
IBM22 citations93
US9276013B1Mar 1, 2016
Integrated formation of Si and SiGe fins
IBM21 citations93
US8993399B2Mar 31, 2015
FinFET structures having silicon germanium and silicon fins
IBM25 citations93
US8946007B2Feb 3, 2015
Inverted thin channel mosfet with self-aligned expanded source/drain
IBM17 citations93
US8895381B1Nov 25, 2014
Method of co-integration of strained-Si and relaxed Si or strained SiGe FETs on insulator with planar and non-planar architectures
IBM25 citations93
US8878311B2Nov 4, 2014
Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same
IBM20 citations93
BEDELL STEPHEN W
1 patentBASKER VEERARAGHAVAN S
1 patentShowing the top 50 of 716 patents by PatentIndex Score.