Inventor
CHO GYOKUBU
JP15 patents
⚠️ This page may combine multiple inventors who share the name “CHO GYOKUBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITUTOYO CORP
14 patentsUS9726473B2Aug 8, 2017
Light interference measuring device and program therefor
MITUTOYO CORP3 citations72
US10753887B2Aug 25, 2020
X-ray CT measuring apparatus and interference prevention method thereof
MITUTOYO CORP2 citations71
US10027885B2Jul 17, 2018
Image measuring apparatus
MITUTOYO CORP2 citations69
US11215788B2Jan 4, 2022
Variable focal length lens device and variable focal length lens control method
MITUTOYO CORP0 citations62
US11037337B2Jun 15, 2021
Method and apparatus for generating measurement plan for measuring X-ray CT
MITUTOYO CORP1 citations61
US12210722B2Jan 28, 2025
Position specifying method and program
MITUTOYO CORP0 citations60
US11656733B2May 23, 2023
Position specifying method and program
MITUTOYO CORP0 citations60
US11314374B2Apr 26, 2022
Position specifying method and program
MITUTOYO CORP0 citations60
US10618220B2Apr 14, 2020
Object-forming machine, cross-section measurement apparatus, and cross-section measurement method
MITUTOYO CORP0 citations51
US10343334B2Jul 9, 2019
Object-forming machine, cross-section measurement apparatus, and cross-section measurement method
MITUTOYO CORP0 citations51
US10656780B2May 19, 2020
Position specifying method and program
MITUTOYO CORP0 citations50
US11257205B2Feb 22, 2022
Image measuring method and apparatus
MITUTOYO CORP0 citations47
US10642017B2May 5, 2020
Imaging system and imaging method
MITUTOYO CORP0 citations37
US10102631B2Oct 16, 2018
Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program
MITUTOYO CORP0 citations37