Inventor

CONBOY MICHAEL R

US64 patents

⚠️ This page may combine multiple inventors who share the name “CONBOY MICHAEL R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CONBOY MICHAEL R

ADVANCED MICRO DEVICES INC

Fault notification based on a severity level

Method and apparatus for monitoring consumable performance

Programmable semiconductor wafer for sensing, recording and retrieving fabrication process conditions to which the wafer is exposed

Management of move requests from a factory system to an automated material handling system

Integrated wafer stocker and sorter with integrity verification system

Flow control in a semiconductor fabrication facility

Automated material handling system method and arrangement

System and method for managing empty carriers in an automated material handling system

Method and apparatus for proactive dispatch system to improve line balancing

Automated material handling system for a manufacturing facility divided into separate fabrication areas

Electrode position controller for a semiconductor etching device

Managing a semiconductor fabrication facility using wafer lot and cassette attributes

Mask identification database server

Realtime decision making system for reduction of time delays in an automated material handling system

Probabilistic dispatching method and arrangement

Automated material handling system method and arrangement

Electrode reshaping in a semiconductor etching device

Material movement server

Workpiece monitoring process using a workpiece carrier having an identification code

Routing workpieces based upon detecting a fault

Method and apparatus for performing fault detection using data from a database

Method and apparatus for controlling a multi-chamber processing tool

Integration of business rule parameters in priority setting of wafer processing

Wafer-less qualification of a processing tool

Wafer rotation randomization for process defect detection in semiconductor fabrication

Method and apparatus for increasing database availability

Integrated reticle sorter and stocker

Automated wafer transfer system

Container-less transfer of semiconductor wafers through a barrier between fabrication areas

Management of move requests from a factory system to an automated material handling system

Method for requesting trace data reports from FDC semiconductor fabrication processes

Method and apparatus for using latency time as a run-to-run control parameter

Reticle sorter

Wafer fabrication robotic interface unit

Method of dynamically designing a preventative maintenance schedule based upon sensor data, and system for accomplishing same

Method and apparatus for determining wafer identity and orientation

Method and apparatus for identifying the position of a selected semiconductor die relative to other dice formed from the same semiconductor wafer

Determining a possible cause of a fault in a semiconductor fabrication process

Predictive processing method in a semiconductor processing facility

Method for determining, tracking and/or controlling processing based upon silicon characteristics

Method and apparatus for aligning wafers

Operating a processing tool in a degraded mode upon detecting a fault

Method and apparatus for generating real-time data from static files

Reticle stocking and sorting management system

Managing test material in an automated material handling system

Apparatus for the non-contact manipulation of a semiconductor die

ADVANCE MICRO DEVICES INC

Management of multiple types of empty carriers in automated material handling systems

Scheduling method for automated work-cell transfer system

HIMONT INC

Impact modified graft copolymer compositions containing broad molecular weight distribution polypropylene

WESTERN GEOPHYSICAL CO

Ring paravane