Inventor

PRATER CRAIG

US60 patents

⚠️ This page may combine multiple inventors who share the name “PRATER CRAIG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PRATER CRAIG

PHOTOTHERMAL SPECTROSCOPY CORP

Method and apparatus for enhanced photo-thermal imaging and spectroscopy

Method and apparatus for enhanced photo-thermal imaging and spectroscopy

Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniques

Asymmetric interferometric optical photothermal infrared spectroscopy

Autofluorescence photothermal characterization systems and methods

Fluorescence enhanced photothermal infrared spectroscopy and confocal fluorescence imaging

Interferometric optical photothermal infrared spectroscopy

Photothermal infrared spectroscopy utilizing spatial light manipulation

Method and apparatus for reducing noise in spectroscopic data at a point on a sample

Autofluorescence enhanced photothermal infrared spectroscopy

Fluorescence enhanced photothermal infrared spectroscopy and confocal fluorescence imaging

Method and apparatus for improved composite multi-wavelength photothermal infrared imaging

Method and apparatus for enhanced photo-thermal imaging and spectroscopy

Method and apparatus for enhanced photo-thermal imaging and spectroscopy

Wide area optical photothermal infrared spectroscopy

Asymmetric interferometric optical photothermal infrared spectroscopy

BRUKER NANO INC

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

Method and apparatus for chemical and optical imaging with a broadband source

Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effect

Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

Closed loop controller and method for fast scanning probe microscopy

Closed loop controller and method for fast scanning probe microscopy

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

Surface sensitive atomic force microscope based infrared spectroscopy

PRATER CRAIG

Multiple modulation heterodyne infrared spectroscopy

Stimulated raman nanospectroscopy

Method and apparatus for infrared scattering scanning near-field optical microscopy

Dynamic power control for nanoscale spectroscopy

Method and apparatus for infrared scattering scanning near-field optical microscopy

Dynamic power control, beam alignment and focus for nanoscale spectroscopy

High frequency deflection measurement of IR absorption with a modulated IR source

Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection

VEECO INSTR INC

Fast-scanning SPM and method of operating same

Thermal mechanical drive actuator, thermal probe and method of thermally driving a probe

Method and apparatus for obtaining quantitative measurements using a probe based instrument

DAZZI A DAZZI

High frequency deflection measurement of IR absorption

High frequency deflection measurement of IR absorption

KING WILLIAM P

Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer

Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy

ANASYS INSTR

Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy

Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy

PHAN NGHI

Fast-scanning SPM scanner and method of operating same

Fast-scanning SPM scanner and method of operating same

UNIV CALIFORNIA

Universal, microfabricated probe for scanning probe microscopes

DOW CHEMICAL CO

Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging

KJOLLER KEVIN

Transition temperature microscopy

BELKIN MIKHAIL

High frequency deflection measurement of IR absorption

SHI JIAN

Closed loop controller and method for fast scanning probe microscopy

UNIV ILLINOIS

Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy