Inventor
LEBEAU CHRISTOPHER J
US12 patents
Patents
12 patentsUS5212390AMay 18, 1993
Lead inspection method using a plane of light for producing reflected lead images
MOTOROLA INC133 citations97
US5204910AApr 20, 1993
Method for detection of defects lacking distinct edges
MOTOROLA INC64 citations95
US5129009AJul 7, 1992
Method for automatic semiconductor wafer inspection
MOTOROLA INC108 citations95
US5563703AOct 8, 1996
Lead coplanarity inspection apparatus and method thereof
MOTOROLA INC65 citations94
US5201841AApr 13, 1993
Thermal delay non-destructive bond integrity inspection
MOTOROLA INC22 citations92
US5137362AAug 11, 1992
Automatic package inspection method
MOTOROLA INC46 citations92
US5246291ASep 21, 1993
Bond inspection technique for a semiconductor chip
MOTOROLA INC39 citations90
US5115475AMay 19, 1992
Automatic semiconductor package inspection method
MOTOROLA INC20 citations81
US6128404AOct 3, 2000
Method of detecting defects in semiconductor package leads
MOTOROLA INC9 citations73
US5452368ASep 19, 1995
Method of detecting defects in semiconductor package leads
MOTOROLA INC14 citations73
US4844576AJul 4, 1989
Light diffuser
MOTOROLA INC1 citations51
US6009187ADec 28, 1999
Wafer prober having an emissive display inspection system and method of use
MOTOROLA INC0 citations48