Inventor
NOBUNAGA DEAN
US29 patents
⚠️ This page may combine multiple inventors who share the name “NOBUNAGA DEAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
22 patentsUS6304510B1Oct 16, 2001
Memory device address decoding
MICRON TECHNOLOGY INC83 citations98
US6310809B1Oct 30, 2001
Adjustable pre-charge in a memory
MICRON TECHNOLOGY INC64 citations96
US6307790B1Oct 23, 2001
Read compression in a memory
MICRON TECHNOLOGY INC42 citations96
US7633804B2Dec 15, 2009
Adjusting programming or erase voltage pulses in response to the number of programming or erase failures
MICRON TECHNOLOGY INC16 citations92
US7231537B2Jun 12, 2007
Fast data access mode in a memory device
MICRON TECHNOLOGY INC16 citations92
US6877100B1Apr 5, 2005
Adjustable timing circuit of an integrated circuit by selecting and moving clock edges based on a signal propagation time stored in a programmable non-volatile fuse circuit
MICRON TECHNOLOGY INC15 citations92
US6584025B2Jun 24, 2003
Read compression in a memory
MICRON TECHNOLOGY INC16 citations92
US6507525B1Jan 14, 2003
Differential sensing in a memory
MICRON TECHNOLOGY INC26 citations92
US7743303B2Jun 22, 2010
Defective memory block remapping method and system, and memory device and processor-based system using same
MICRON TECHNOLOGY INC23 citations90
US7889562B2Feb 15, 2011
Adjusting programming or erase voltage pulses in response to a rate of programming or erasing
MICRON TECHNOLOGY INC11 citations84
US7193910B2Mar 20, 2007
Adjustable timing circuit of an integrated circuit
MICRON TECHNOLOGY INC10 citations84
US6693841B2Feb 17, 2004
Read compression in a memory
MICRON TECHNOLOGY INC13 citations84
US6678201B2Jan 13, 2004
Distributed FIFO in synchronous memory
MICRON TECHNOLOGY INC13 citations84
US6496434B1Dec 17, 2002
Differential sensing in a memory using two cycle pre-charge
MICRON TECHNOLOGY INC18 citations84
US7130227B2Oct 31, 2006
Adjustable timing circuit of an integrated circuit
MICRON TECHNOLOGY INC9 citations74
US7080275B2Jul 18, 2006
Method and apparatus using parasitic capacitance for synchronizing signals a device
MICRON TECHNOLOGY INC8 citations74
US7724592B2May 25, 2010
Internal data comparison for memory testing
MICRON TECHNOLOGY INC2 citations63
US7627772B2Dec 1, 2009
Fast data access mode in a memory device
MICRON TECHNOLOGY INC2 citations63
US7480195B2Jan 20, 2009
Internal data comparison for memory testing
MICRON TECHNOLOGY INC3 citations63
US7958439B2Jun 7, 2011
Defective memory block remapping method and system, and memory device and processor-based system using same
MICRON TECHNOLOGY INC2 citations60
US8806155B2Aug 12, 2014
Methods and apparatus for designating or using data status indicators
MICRON TECHNOLOGY INC0 citations51
US8386724B2Feb 26, 2013
Methods and apparatus for designating or using data status indicators
MICRON TECHNOLOGY INC0 citations51
NOBUNAGA DEAN
5 patentsUS8321713B2Nov 27, 2012
Fast data access mode in a memory device
NOBUNAGA DEAN29 citations92
US8295098B2Oct 23, 2012
Local sensing in a memory device
NOBUNAGA DEAN10 citations82
US8601331B2Dec 3, 2013
Defective memory block remapping method and system, and memory device and processor-based system using same
NOBUNAGA DEAN3 citations59
US8462536B2Jun 11, 2013
Method and apparatus for addressing memory arrays
NOBUNAGA DEAN4 citations59
US8416628B2Apr 9, 2013
Local sensing in a memory device
NOBUNAGA DEAN0 citations50