Inventor
CHANG FANG-CHENG
US25 patents
⚠️ This page may combine multiple inventors who share the name “CHANG FANG-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNOPSYS INC
12 patentsUS7107571B2Sep 12, 2006
Visual analysis and verification system using advanced tools
SYNOPSYS INC87 citations97
US7093229B2Aug 15, 2006
System and method for providing defect printability analysis of photolithographic masks with job-based automation
SYNOPSYS INC54 citations96
US7014955B2Mar 21, 2006
System and method for indentifying dummy features on a mask layer
SYNOPSYS INC24 citations93
US7617474B2Nov 10, 2009
System and method for providing defect printability analysis of photolithographic masks with job-based automation
SYNOPSYS INC22 citations92
US6996790B2Feb 7, 2006
System and method for generating a two-dimensional yield map for a full layout
SYNOPSYS INC22 citations92
US6988259B2Jan 17, 2006
Method and apparatus for mixed-mode optical proximity correction
SYNOPSYS INC17 citations92
US6880135B2Apr 12, 2005
Method of incorporating lens aberration information into various process flows
SYNOPSYS INC34 citations91
US7457736B2Nov 25, 2008
Automated creation of metrology recipes
SYNOPSYS INC15 citations84
US7356788B2Apr 8, 2008
Method and apparatus for data hierarchy maintenance in a system for mask description
SYNOPSYS INC12 citations84
US6976240B2Dec 13, 2005
Simulation using design geometry information
SYNOPSYS INC15 citations84
US7523027B2Apr 21, 2009
Visual inspection and verification system
SYNOPSYS INC14 citations82
US7483559B2Jan 27, 2009
Method and apparatus for deblurring mask images
SYNOPSYS INC13 citations79
NUMERICAL TECH INC
9 patentsUS6470489B1Oct 22, 2002
Design rule checking system and method
NUMERICAL TECH INC516 citations99
US6453452B1Sep 17, 2002
Method and apparatus for data hierarchy maintenance in a system for mask description
NUMERICAL TECH INC186 citations99
US6370679B1Apr 9, 2002
Data hierarchy layout correction and verification method and apparatus
NUMERICAL TECH INC498 citations99
US6757645B2Jun 29, 2004
Visual inspection and verification system
NUMERICAL TECH INC207 citations97
US6584609B1Jun 24, 2003
Method and apparatus for mixed-mode optical proximity correction
NUMERICAL TECH INC99 citations97
US6560766B2May 6, 2003
Method and apparatus for analyzing a layout using an instance-based representation
NUMERICAL TECH INC82 citations97
US6795168B2Sep 21, 2004
Method and apparatus for exposing a wafer using multiple masks during an integrated circuit manufacturing process
NUMERICAL TECH INC27 citations93
US6523162B1Feb 18, 2003
General purpose shape-based layout processing scheme for IC layout modifications
NUMERICAL TECH INC108 citations93
US6721928B2Apr 13, 2004
Verification utilizing instance-based hierarchy management
NUMERICAL TECH INC17 citations84