Inventor
ASAKURA HISAO
JP14 patents
⚠️ This page may combine multiple inventors who share the name “ASAKURA HISAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
12 patentsUS6771077B2Aug 3, 2004
Method of testing electronic devices indicating short-circuit
HITACHI LTD85 citations98
US6287912B1Sep 11, 2001
Method of fabricating semiconductor device
HITACHI LTD18 citations84
US6399453B2Jun 4, 2002
Process of manufacturing semiconductor integrated circuit device having an amorphous silicon gate
HITACHI LTD13 citations74
US6895346B2May 17, 2005
Method for test conditions
HITACHI LTD10 citations73
US6780660B2Aug 24, 2004
System for testing electronic devices
HITACHI LTD9 citations73
US6770496B2Aug 3, 2004
Method of testing electronic devices
HITACHI LTD8 citations73
US6566719B1May 20, 2003
Semiconductor integrated circuit
HITACHI LTD7 citations73
US6265254B1Jul 24, 2001
Semiconductor integrated circuit devices and a method of manufacturing the same
HITACHI LTD7 citations73
US6020228AFeb 1, 2000
CMOS device structure with reduced short channel effect and memory capacitor
HITACHI LTD8 citations73
US6198128B1Mar 6, 2001
Method of manufacturing a semiconductor device, and semiconductor device
HITACHI LTD13 citations71
US6812540B2Nov 2, 2004
Semiconductor integrated circuit device
HITACHI LTD6 citations63
US6841405B2Jan 11, 2005
Photomask for test wafers
HITACHI LTD0 citations51