P

Inventor

HIROHARA YOKO

JP32 patents
⚠️ This page may combine multiple inventors who share the name “HIROHARA YOKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOPCON CORP

30 patents
US6685320B2Feb 3, 2004

Opthalmic characteristic measuring apparatus

TOPCON CORP66 citations95
US7441900B2Oct 28, 2008

Contrast chart device, contrast sensitivity measuring device and contrast sensitivity measuring method

TOPCON CORP29 citations93
US7309126B2Dec 18, 2007

Eye characteristics measuring device

TOPCON CORP30 citations93
US7270413B2Sep 18, 2007

Ophthalmic data measuring apparatus, ophthalmic data measurement program and eye characteristic measuring apparatus

TOPCON CORP44 citations93
US7246906B2Jul 24, 2007

Correction-factor determination apparatus and method

TOPCON CORP32 citations93
US6905209B2Jun 14, 2005

Optical characteristics measuring device

TOPCON CORP21 citations93
US7360894B2Apr 22, 2008

Opthalmological apparatus

TOPCON CORP27 citations92
US6525883B2Feb 25, 2003

Optical characteristic measuring instrument

TOPCON CORP27 citations91
US7568800B2Aug 4, 2009

Apparatus and method for spectrally measuring fundus

TOPCON CORP9 citations84
US7465049B2Dec 16, 2008

Portable ophthalmic apparatus and ophthalmic system

TOPCON CORP15 citations84
US7216980B2May 15, 2007

Eye characteristic measuring apparatus

TOPCON CORP17 citations84
US6802609B2Oct 12, 2004

Eye characteristic measuring apparatus

TOPCON CORP15 citations84
US6629761B1Oct 7, 2003

Eye characteristic measuring apparatus

TOPCON CORP16 citations84
US6536900B2Mar 25, 2003

Eye characteristic measuring apparatus

TOPCON CORP13 citations84
US7249851B2Jul 31, 2007

Eye characteristic measuring apparatus

TOPCON CORP11 citations83
US7036933B2May 2, 2006

Model eye for eye characteristic measuring device and calibration method for the same

TOPCON CORP12 citations83
US6695450B2Feb 24, 2004

Ophthalmic characteristics measuring apparatus

TOPCON CORP13 citations81
US7311402B2Dec 25, 2007

Eye optical characteristic measuring instrument

TOPCON CORP7 citations73
US7490939B2Feb 17, 2009

Eye characteristics measuring system

TOPCON CORP5 citations63
US7249852B2Jul 31, 2007

Eye characteristic measuring apparatus

TOPCON CORP5 citations63
US7222962B2May 29, 2007

Opthalmic measuring apparatus

TOPCON CORP6 citations63
US6354705B1Mar 12, 2002

Anterior segment photographing apparatus for producing images of a section of the anterior segment of the eye to be examined by using slit light beam

TOPCON CORP6 citations63
US7850305B2Dec 14, 2010

Apparatus and method for measuring spectrum image data of eyeground

TOPCON CORP4 citations62
US7806529B2Oct 5, 2010

Device and method for optometry

TOPCON CORP4 citations62
US7677731B2Mar 16, 2010

Eye optical characteristic measuring apparatus

TOPCON CORP2 citations62
US7241012B2Jul 10, 2007

Ophthalmologic apparatus

TOPCON CORP5 citations59
US12582309B2Mar 24, 2026

Ophthalmic apparatus

TOPCON CORP0 citations52
US6860603B2Mar 1, 2005

Best corrected visual acuity characteristics measuring device, best corrected visual acuity characteristics measuring method, contrast sensitivity measuring device, contrast sensitivity measuring method, and contrast sensitivity target displaying device

TOPCON CORP0 citations52
US7309127B2Dec 18, 2007

Ophthalmic measuring apparatus

TOPCON CORP0 citations42
US7219999B2May 22, 2007

Device for measuring optical characteristic of eye

TOPCON CORP0 citations42

Kabuhsiki Kaisha Topcon

1 patent

UNIV OSAKA

1 patent