Inventor
KNEBEL DETLEF
DE12 patents
⚠️ This page may combine multiple inventors who share the name “KNEBEL DETLEF”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JPK INSTRUMENTS AG
6 patentsUS7022985B2Apr 4, 2006
Apparatus and method for a scanning probe microscope
JPK INSTRUMENTS AG122 citations96
US7442922B2Oct 28, 2008
Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology
JPK INSTRUMENTS AG18 citations79
US7155962B2Jan 2, 2007
Method and apparatus to study a surfactant
JPK INSTRUMENTS AG8 citations69
US7473894B2Jan 6, 2009
Apparatus and method for a scanning probe microscope
JPK INSTRUMENTS AG4 citations60
US7934323B2May 3, 2011
Method and a device for the positioning of a displaceable component in an examining system
JPK INSTRUMENTS AG0 citations49
US7971266B2Jun 28, 2011
Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope
JPK INSTRUMENTS AG0 citations46
BRUKER NANO GMBH
2 patentsUS11156632B2Oct 26, 2021
Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscope
BRUKER NANO GMBH1 citations53
US10539591B2Jan 21, 2020
Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope
BRUKER NANO GMBH0 citations31