Inventor
CHANG MING-TUNG
TW7 patents
⚠️ This page may combine multiple inventors who share the name “CHANG MING-TUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNTEST TECHNOLOGIES INC
4 patentsUS7191373B2Mar 13, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC48 citations94
US7444567B2Oct 28, 2008
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
SYNTEST TECHNOLOGIES INC17 citations92
US7284175B2Oct 16, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC30 citations92
US7512851B2Mar 31, 2009
Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC39 citations91