Inventor
LIN SHYH-HORNG
TW15 patents
⚠️ This page may combine multiple inventors who share the name “LIN SHYH-HORNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNTEST TECHNOLOGIES INC
9 patentsUS7412672B1Aug 12, 2008
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC36 citations96
US6957403B2Oct 18, 2005
Computer-aided design system to automate scan synthesis at register-transfer level
SYNTEST TECHNOLOGIES INC69 citations95
US7191373B2Mar 13, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC48 citations94
US7444567B2Oct 28, 2008
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
SYNTEST TECHNOLOGIES INC17 citations92
US7552373B2Jun 23, 2009
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC36 citations91
US7512851B2Mar 31, 2009
Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC39 citations91
US7331032B2Feb 12, 2008
Computer-aided design system to automate scan synthesis at register-transfer level
SYNTEST TECHNOLOGIES INC12 citations91
US7721173B2May 18, 2010
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC3 citations61
US7228479B2Jun 5, 2007
IEEE Std. 1149.4 compatible analog BIST methodology
SYNTEST TECHNOLOGIES INC1 citations50