Inventor
CHAO HAO-JAN
TW10 patents
⚠️ This page may combine multiple inventors who share the name “CHAO HAO-JAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNTEST TECHNOLOGIES INC
8 patentsUS7058869B2Jun 6, 2006
Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits
SYNTEST TECHNOLOGIES INC119 citations97
US7007213B2Feb 28, 2006
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC52 citations95
US7191373B2Mar 13, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC48 citations94
US7284175B2Oct 16, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC30 citations92
US7779323B2Aug 17, 2010
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC5 citations73
US9057763B2Jun 16, 2015
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC2 citations61
US9026875B2May 5, 2015
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC2 citations61
US8769359B2Jul 1, 2014
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC1 citations61