Inventor
HSU PO-CHING
TW17 patents
⚠️ This page may combine multiple inventors who share the name “HSU PO-CHING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNTEST TECHNOLOGIES INC
15 patentsUS7058869B2Jun 6, 2006
Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits
SYNTEST TECHNOLOGIES INC119 citations97
US7007213B2Feb 28, 2006
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC52 citations95
US7191373B2Mar 13, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC48 citations94
US7444567B2Oct 28, 2008
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
SYNTEST TECHNOLOGIES INC17 citations92
US7284175B2Oct 16, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC30 citations92
US7260756B1Aug 21, 2007
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test
SYNTEST TECHNOLOGIES INC11 citations84
US9046572B2Jun 2, 2015
Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults
SYNTEST TECHNOLOGIES INC6 citations82
US7434126B2Oct 7, 2008
Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults
SYNTEST TECHNOLOGIES INC8 citations74
US7779323B2Aug 17, 2010
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC5 citations73
US9057763B2Jun 16, 2015
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC2 citations61
US9026875B2May 5, 2015
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC2 citations61
US8769359B2Jul 1, 2014
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
SYNTEST TECHNOLOGIES INC1 citations61
US9316688B2Apr 19, 2016
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test
SYNTEST TECHNOLOGIES INC0 citations52
US9274168B2Mar 1, 2016
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test
SYNTEST TECHNOLOGIES INC0 citations52
US9091730B2Jul 28, 2015
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test
SYNTEST TECHNOLOGIES INC0 citations52