Inventor

TSAI SEN-WEI

TW4 patents

⚠️ This page may combine multiple inventors who share the name “TSAI SEN-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SYNTEST TECHNOLOGIES INC

3 patents

US7191373B2Mar 13, 2007

Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques

SYNTEST TECHNOLOGIES INC48 citations94

US7552373B2Jun 23, 2009

Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit

SYNTEST TECHNOLOGIES INC36 citations91

US7721173B2May 18, 2010

Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit

SYNTEST TECHNOLOGIES INC3 citations61

SYNTEST TECH INC

1 patent

US9696377B2Jul 4, 2017

Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit

SYNTEST TECH INC0 citations48