Inventor
HSU CHI-CHAN
TW4 patents
Patents
4 patentsUS6954887B2Oct 11, 2005
Multiple-capture DFT system for scan-based integrated circuits
SYNTEST TECHNOLOGIES INC64 citations95
US7191373B2Mar 13, 2007
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
SYNTEST TECHNOLOGIES INC48 citations94
US7444567B2Oct 28, 2008
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
SYNTEST TECHNOLOGIES INC17 citations92
US7904773B2Mar 8, 2011
Multiple-capture DFT system for scan-based integrated circuits
SYNTEST TECHNOLOGIES INC4 citations61