Inventor
WATSON KIMBALL M
US23 patents
⚠️ This page may combine multiple inventors who share the name “WATSON KIMBALL M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
15 patentsUS5634001AMay 27, 1997
Method to calculate hot-electron test voltage differential for assessing microprocessor reliability
IBM20 citations90
US5533197AJul 2, 1996
Method to assess electromigration and hot electron reliability for microprocessors
IBM23 citations90
US7904868B2Mar 8, 2011
Structures including means for lateral current carrying capability improvement in semiconductor devices
IBM8 citations84
US7904273B2Mar 8, 2011
In-line depth measurement for thru silicon via
IBM11 citations83
US7064409B2Jun 20, 2006
Structure and programming of laser fuse
IBM6 citations73
US7453151B2Nov 18, 2008
Methods for lateral current carrying capability improvement in semiconductor devices
IBM5 citations63
US7981732B2Jul 19, 2011
Programming of laser fuse
IBM2 citations62
US7968975B2Jun 28, 2011
Metal wiring structure for integration with through substrate vias
IBM2 citations62
US7384824B2Jun 10, 2008
Structure and programming of laser fuse
IBM2 citations62
US7919834B2Apr 5, 2011
Edge seal for thru-silicon-via technology
IBM4 citations57
US9059051B2Jun 16, 2015
Inline measurement of through-silicon via depth
IBM0 citations51
US8765568B2Jul 1, 2014
Method of fabricating thermally controlled refractory metal resistor
IBM0 citations51
US8017514B2Sep 13, 2011
Optically transparent wires for secure circuits and methods of making same
IBM0 citations50
US9496110B2Nov 15, 2016
Micro-electro-mechanical system (MEMS) structure and design structures
IBM1 citations46
US7919830B2Apr 5, 2011
Method and structure for ballast resistor
IBM0 citations42