Inventor
KAJI KAZUTOSHI
JP19 patents
⚠️ This page may combine multiple inventors who share the name “KAJI KAZUTOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
8 patentsUS6794648B2Sep 21, 2004
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
HITACHI LTD19 citations92
US6703613B2Mar 9, 2004
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
HITACHI LTD28 citations92
US7476872B2Jan 13, 2009
Method and apparatus for observing inside structures, and specimen holder
HITACHI LTD9 citations84
US7928376B2Apr 19, 2011
Element mapping unit, scanning transmission electron microscope, and element mapping method
HITACHI LTD15 citations83
US6933501B2Aug 23, 2005
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
HITACHI LTD10 citations74
US7462830B2Dec 9, 2008
Method and apparatus for observing inside structures, and specimen holder
HITACHI LTD2 citations62
US6933500B2Aug 23, 2005
Electron microscope
HITACHI LTD3 citations62
US7544935B2Jun 9, 2009
Method and apparatus for evaluating thin films
HITACHI LTD1 citations50
HITACHI HIGH TECH CORP
7 patentsUS7250601B2Jul 31, 2007
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
HITACHI HIGH TECH CORP15 citations92
US6930306B2Aug 16, 2005
Electron microscope
HITACHI HIGH TECH CORP15 citations84
US7888641B2Feb 15, 2011
Electron microscope with electron spectrometer
HITACHI HIGH TECH CORP6 citations70
US8344320B2Jan 1, 2013
Electron microscope with electron spectrometer
HITACHI HIGH TECH CORP4 citations59
US6855927B2Feb 15, 2005
Method and apparatus for observing element distribution
HITACHI HIGH TECH CORP3 citations58
US7872232B2Jan 18, 2011
Electronic microscope apparatus
HITACHI HIGH TECH CORP0 citations41
US10373802B2Aug 6, 2019
Transmission scanning microscopy including electron energy loss spectroscopy and observation method thereof
HITACHI HIGH TECH CORP0 citations36