P

Inventor

PAPA RAO SATYAVOLU S

US42 patents
⚠️ This page may combine multiple inventors who share the name “PAPA RAO SATYAVOLU S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEXAS INSTRUMENTS INC

19 patents
US6803641B2Oct 12, 2004

MIM capacitors and methods for fabricating same

TEXAS INSTRUMENTS INC100 citations95
US7442597B2Oct 28, 2008

Systems and methods that selectively modify liner induced stress

TEXAS INSTRUMENTS INC18 citations92
US7397107B2Jul 8, 2008

Ferromagnetic capacitor

TEXAS INSTRUMENTS INC16 citations92
US6864108B1Mar 8, 2005

Measurement of wafer temperature in semiconductor processing chambers

TEXAS INSTRUMENTS INC29 citations92
US6919233B2Jul 19, 2005

MIM capacitors and methods for fabricating same

TEXAS INSTRUMENTS INC18 citations90
US7436281B2Oct 14, 2008

Method to improve inductance with a high-permeability slotted plate core in an integrated circuit

TEXAS INSTRUMENTS INC9 citations84
US7118925B2Oct 10, 2006

Fabrication of a ferromagnetic inductor core and capacitor electrode in a single photo mask step

TEXAS INSTRUMENTS INC11 citations84
US7179747B2Feb 20, 2007

Use of supercritical fluid for low effective dielectric constant metallization

TEXAS INSTRUMENTS INC17 citations83
US7250334B2Jul 31, 2007

Metal insulator metal (MIM) capacitor fabrication with sidewall spacers and aluminum cap (ALCAP) top electrode

TEXAS INSTRUMENTS INC17 citations82
US7969274B2Jun 28, 2011

Method to improve inductance with a high-permeability slotted plate core in an integrated circuit

TEXAS INSTRUMENTS INC6 citations73
US7115467B2Oct 3, 2006

Metal insulator metal (MIM) capacitor fabrication with sidewall barrier removal aspect

TEXAS INSTRUMENTS INC9 citations72
US6924208B2Aug 2, 2005

Dual mask capacitor for integrated circuits

TEXAS INSTRUMENTS INC6 citations71
US6898068B2May 24, 2005

Dual mask capacitor for integrated circuits

TEXAS INSTRUMENTS INC9 citations71
US7674682B2Mar 9, 2010

Capacitor integration at top-metal level with a protective cladding for copper surface protection

TEXAS INSTRUMENTS INC2 citations62
US7485963B2Feb 3, 2009

Use of supercritical fluid for low effective dielectric constant metallization

TEXAS INSTRUMENTS INC2 citations62
US7291897B2Nov 6, 2007

One mask high density capacitor for integrated circuits

TEXAS INSTRUMENTS INC5 citations62
US7015093B2Mar 21, 2006

Capacitor integration at top-metal level with a protection layer for the copper surface

TEXAS INSTRUMENTS INC2 citations62
US6900127B2May 31, 2005

Multilayer integrated circuit copper plateable barriers

TEXAS INSTRUMENTS INC5 citations62
US7939400B2May 10, 2011

Systems and methods that selectively modify liner induced stress

TEXAS INSTRUMENTS INC0 citations51

IBM

16 patents
US9246112B2Jan 26, 2016

Semiconductor device with ballistic gate length structure

IBM6 citations84
US9786852B2Oct 10, 2017

Semiconductor device with ballistic gate length structure

IBM3 citations73
US9608134B2Mar 28, 2017

Processes for uniform metal semiconductor alloy formation for front side contact metallization and photovoltaic device formed therefrom

IBM2 citations73
US9128078B2Sep 8, 2015

Manufacturable sub-3 nanometer palladium gap devices for fixed electrode tunneling recognition

IBM2 citations63
US9012329B2Apr 21, 2015

Nanogap in-between noble metals

IBM2 citations63
US9013010B2Apr 21, 2015

Nanopore sensor device

IBM2 citations63
US8900975B2Dec 2, 2014

Nanopore sensor device

IBM3 citations63
US8865017B2Oct 21, 2014

Silicon surface texturing method for reducing surface reflectance

IBM2 citations63
US9097698B2Aug 4, 2015

Nanogap device with capped nanowire structures

IBM2 citations60
US10170644B2Jan 1, 2019

Processes for uniform metal semiconductor alloy formation for front side contact metallization and photovoltaic device formed therefrom

IBM0 citations52
US9182369B2Nov 10, 2015

Manufacturable sub-3 nanometer palladium gap devices for fixed electrode tunneling recognition

IBM1 citations52
US10269993B2Apr 23, 2019

Use of metal phosphorus in metallization of photovoltaic devices and method of fabricating same

IBM0 citations51
US10167443B2Jan 1, 2019

Wet clean process for removing CxHyFz etch residue

IBM0 citations51
US9536731B2Jan 3, 2017

Wet clean process for removing CxHyFz etch residue

IBM0 citations51
US8946844B2Feb 3, 2015

Integration of a titania layer in an anti-reflective coating

IBM0 citations51
US9188578B2Nov 17, 2015

Nanogap device with capped nanowire structures

IBM0 citations49

FISHER KATHRYN C

5 patents

KRISHNAN MAHADEVAIYER

1 patent

PAPA RAO SATYAVOLU S

1 patent