P

Inventor

NUTTALL MICHAEL

US101 patents
⚠️ This page may combine multiple inventors who share the name “NUTTALL MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

21 patents
US6797558B2Sep 28, 2004

Methods of forming a capacitor with substantially selective deposite of polysilicon on a substantially crystalline capacitor dielectric layer

MICRON TECHNOLOGY INC50 citations96
US6159852ADec 12, 2000

Method of depositing polysilicon, method of fabricating a field effect transistor, method of forming a contact to a substrate, method of forming a capacitor

MICRON TECHNOLOGY INC77 citations96
US6150706ANov 21, 2000

Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer

MICRON TECHNOLOGY INC34 citations96
US5969983AOct 19, 1999

Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer

MICRON TECHNOLOGY INC38 citations96
US5885896AMar 23, 1999

Using implants to lower anneal temperatures

MICRON TECHNOLOGY INC45 citations96
US5825498AOct 20, 1998

Ultraviolet light reflectance method for evaluating the surface characteristics of opaque materials

MICRON TECHNOLOGY INC54 citations96
US5658381AAug 19, 1997

Method to form hemispherical grain (HSG) silicon by implant seeding followed by vacuum anneal

MICRON TECHNOLOGY INC87 citations96
US6541811B2Apr 1, 2003

Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer

MICRON TECHNOLOGY INC31 citations93
US6509239B1Jan 21, 2003

Method of fabricating a field effect transistor

MICRON TECHNOLOGY INC21 citations93
US6458699B1Oct 1, 2002

Methods of forming a contact to a substrate

MICRON TECHNOLOGY INC17 citations93
US6417015B2Jul 9, 2002

Semiconductor processing methods and semiconductor defect detection methods

MICRON TECHNOLOGY INC20 citations93
US6262485B1Jul 17, 2001

Using implants to lower anneal temperatures

MICRON TECHNOLOGY INC16 citations93
US6251693B1Jun 26, 2001

Semiconductor processing methods and semiconductor defect detection methods

MICRON TECHNOLOGY INC17 citations93
US6225157B1May 1, 2001

Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer

MICRON TECHNOLOGY INC21 citations93
US6027984AFeb 22, 2000

Method for growing oxide

MICRON TECHNOLOGY INC18 citations93
US5831282ANov 3, 1998

Method of producing an HSG structure using an amorphous silicon disorder layer as a substrate

MICRON TECHNOLOGY INC18 citations93
US5712186AJan 27, 1998

Method for growing field oxide to minimize birds' beak length

MICRON TECHNOLOGY INC34 citations93
US6275292B1Aug 14, 2001

Reflectance method for evaluating the surface characteristics of opaque materials

MICRON TECHNOLOGY INC23 citations92
US6195163B1Feb 27, 2001

Reflectance method for evaluating the surface characteristics of opaque materials

MICRON TECHNOLOGY INC18 citations92
US6682970B1Jan 27, 2004

Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer

MICRON TECHNOLOGY INC14 citations84
US6165853ADec 26, 2000

Trench isolation method

MICRON TECHNOLOGY INC17 citations84

MATTEL INC

7 patents

NUTTALL MICHAEL

7 patents

MARTIN RUTH E

4 patents

TRUDELL MEDICAL INT

3 patents

O'CONNOR STACY L

3 patents

MICROSOFT CORP

2 patents

O'CONNOR STACY LYNN

2 patents

SMITH CORONA CORP

1 patent

Showing the top 50 of 101 patents by PatentIndex Score.