Inventor

MORISHITA HIDEO

JP21 patents

⚠️ This page may combine multiple inventors who share the name “MORISHITA HIDEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MORISHITA HIDEO

HITACHI HIGH TECH CORP

Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member

Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun

Scanning electron microscope

Scanning electron microscope and method for analyzing secondary electron spin polarization

Composite charged particle beam device

Sample holder with light emitting and transferring elements for a charged particle beam apparatus

Electron beam apparatus

Charged particle beam device

Charged particle beam device

Scanning electron microscope

Spin polarimeter

Electron beam application device

Electron gun and electron beam application device

Charged particle beam device

Scanning electron microscope

Electron gun and electron microscope

Electron gun and electron beam application apparatus

MORISHITA HIDEO

Scanning electron microscope

Charged particle beam apparatus

OHSHIMA TAKASHI

Electron beam apparatus for visualizing a displacement of an electric field

HITACHI LTD

Scanning electron microscope and electron trajectory adjustment method therefor