Inventor
LIN CHU-FU
TW19 patents
⚠️ This page may combine multiple inventors who share the name “LIN CHU-FU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
15 patentsUS9035457B2May 19, 2015
Substrate with integrated passive devices and method of manufacturing the same
UNITED MICROELECTRONICS CORP21 citations92
US9123789B2Sep 1, 2015
Chip with through silicon via electrode and method of forming the same
UNITED MICROELECTRONICS CORP12 citations84
US10340231B2Jul 2, 2019
Semiconductor package structure and method for forming the same
UNITED MICROELECTRONICS CORP2 citations73
US10192808B1Jan 29, 2019
Semiconductor structure
UNITED MICROELECTRONICS CORP2 citations71
US10886241B1Jan 5, 2021
Semiconductor package structure
UNITED MICROELECTRONICS CORP0 citations62
US8884398B2Nov 11, 2014
Anti-fuse structure and programming method thereof
UNITED MICROELECTRONICS CORP2 citations62
US12557303B2Feb 17, 2026
Capacitor structure and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations61
US12040354B2Jul 16, 2024
Capacitor structure and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations61
US12034038B2Jul 9, 2024
Method for manufacturing capacitor structure
UNITED MICROELECTRONICS CORP0 citations61
US11646343B2May 9, 2023
Capacitor structure and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations61
US11616035B2Mar 28, 2023
Semiconductor structure
UNITED MICROELECTRONICS CORP0 citations61
US10818616B2Oct 27, 2020
Semiconductor package structure and method for forming the same
UNITED MICROELECTRONICS CORP0 citations52
US9437491B2Sep 6, 2016
Method of forming chip with through silicon via electrode
UNITED MICROELECTRONICS CORP0 citations52
US9269645B1Feb 23, 2016
Fan-out wafer level package
UNITED MICROELECTRONICS CORP0 citations52
US10504821B2Dec 10, 2019
Through-silicon via structure
UNITED MICROELECTRONICS CORP0 citations51
MEGICA CORP
3 patentsUS7855461B2Dec 21, 2010
Chip structure with bumps and testing pads
MEGICA CORP19 citations91
US7394161B2Jul 1, 2008
Chip structure with pads having bumps or wirebonded wires formed thereover or used to be tested thereto
MEGICA CORP24 citations91
US7977803B2Jul 12, 2011
Chip structure with bumps and testing pads
MEGICA CORP3 citations61