Inventor
ISHIKAWA AKIO
JP37 patents
⚠️ This page may combine multiple inventors who share the name “ISHIKAWA AKIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PANAHPOUR TEHRANI MEHRDAD
6 patentsUS8204316B2Jun 19, 2012
Apparatus, method and computer program for classifying pixels in a motion picture as foreground or background
PANAHPOUR TEHRANI MEHRDAD30 citations91
US8687000B2Apr 1, 2014
Image generating apparatus and computer program
PANAHPOUR TEHRANI MEHRDAD8 citations82
US8428350B2Apr 23, 2013
Color correction apparatus, method and computer program
PANAHPOUR TEHRANI MEHRDAD4 citations61
US8164633B2Apr 24, 2012
Calibration apparatus and method for imaging devices and computer program
PANAHPOUR TEHRANI MEHRDAD2 citations61
US8811717B2Aug 19, 2014
Image generating apparatus and computer program
PANAHPOUR TEHRANI MEHRDAD0 citations50
US8548227B2Oct 1, 2013
Image processing apparatus and computer program
PANAHPOUR TEHRANI MEHRDAD1 citations50
SONY CORP
6 patentsUS6665690B2Dec 16, 2003
System and method for determining respective lengths of recording units used for recording different types of data on disc medium
SONY CORP40 citations91
US6349080B1Feb 19, 2002
Method and apparatus for efficient reading of data from disc record medium by selecting reading order of data units
SONY CORP9 citations74
US7096237B2Aug 22, 2006
Recording and/or reproduction apparatus, file management method and providing medium
SONY CORP9 citations72
US7356249B2Apr 8, 2008
Apparatus and method for recording/reproducing data, which enable reading of data recorded even when the apparatus stops due to a power failure
SONY CORP2 citations61
US6728175B2Apr 27, 2004
Information recording method and apparatus
SONY CORP2 citations61
US6356521B1Mar 12, 2002
Information recording method and apparatus
SONY CORP3 citations61
TOKYO SEIMITSU CO LTD
5 patentsUS7330581B2Feb 12, 2008
Image defect inspection method, image defect inspection apparatus and appearance inspection apparatus
TOKYO SEIMITSU CO LTD16 citations84
US7327871B2Feb 5, 2008
Defect inspecting method, defect inspecting apparatus and inspection machine
TOKYO SEIMITSU CO LTD11 citations84
US7346207B2Mar 18, 2008
Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus
TOKYO SEIMITSU CO LTD3 citations63
US7492942B2Feb 17, 2009
Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus
TOKYO SEIMITSU CO LTD4 citations61
US7336815B2Feb 26, 2008
Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus
TOKYO SEIMITSU CO LTD0 citations42
ISHIKAWA AKIO
4 patentsUS10109427B2Oct 23, 2018
Layer compositions with improved electrical parameters comprising PEDOT/PSS and a stabilizer
ISHIKAWA AKIO16 citations91
US8311089B2Nov 13, 2012
Multi-view video compression coding method and apparatus
ISHIKAWA AKIO15 citations83
US8243122B2Aug 14, 2012
Video method for generating free viewpoint video image using divided local regions
ISHIKAWA AKIO8 citations83
US8259160B2Sep 4, 2012
Method for generating free viewpoint video image in three-dimensional movement and recording medium
ISHIKAWA AKIO1 citations51
NIPPON STEEL CORP
3 patentsUS5841185ANov 24, 1998
Semiconductor device having CMOS transistors
NIPPON STEEL CORP32 citations92
US5828120AOct 27, 1998
Semiconductor device and production method thereof
NIPPON STEEL CORP25 citations92
US5714787AFeb 3, 1998
Semiconductor device with a reduced element isolation region
NIPPON STEEL CORP3 citations62
KITAMURA TADASHI
2 patentsUS8422761B2Apr 16, 2013
Defect and critical dimension analysis systems and methods for a semiconductor lithographic process
KITAMURA TADASHI12 citations83
US8150140B2Apr 3, 2012
System and method for a semiconductor lithographic process control using statistical information in defect identification
KITAMURA TADASHI15 citations83
HERAEUS DEUTSCHLAND GMBH & CO KG
2 patentsUS11600449B2Mar 7, 2023
Layer compositions with improved electrical parameters comprising PEDOT/PSS and a stabilizer
HERAEUS DEUTSCHLAND GMBH & CO KG1 citations62
US11972908B2Apr 30, 2024
Solid electrolytic capacitor with conductive polymer layer attaining excellent metal ion migration resistance
HERAEUS DEUTSCHLAND GMBH & CO KG0 citations56