Inventor
LI YISUO
SG22 patents
⚠️ This page may combine multiple inventors who share the name “LI YISUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHARTERED SEMICONDUCTOR MFG
7 patentsUS7824968B2Nov 2, 2010
LDMOS using a combination of enhanced dielectric stress layer and dummy gates
CHARTERED SEMICONDUCTOR MFG14 citations84
US7253483B2Aug 7, 2007
Semiconductor device layout and channeling implant process
CHARTERED SEMICONDUCTOR MFG2 citations62
US6972236B2Dec 6, 2005
Semiconductor device layout and channeling implant process
CHARTERED SEMICONDUCTOR MFG2 citations62
US7573099B2Aug 11, 2009
Semiconductor device layout and channeling implant process
CHARTERED SEMICONDUCTOR MFG0 citations52
US7867862B2Jan 11, 2011
Semiconductor structure including high voltage device
CHARTERED SEMICONDUCTOR MFG1 citations51
US7259072B2Aug 21, 2007
Shallow low energy ion implantation into pad oxide for improving threshold voltage stability
CHARTERED SEMICONDUCTOR MFG1 citations47
US7202133B2Apr 10, 2007
Structure and method to form source and drain regions over doped depletion regions
CHARTERED SEMICONDUCTOR MFG1 citations46
UNISANTIS ELECT SINGAPORE PTE
5 patentsUS12096608B2Sep 17, 2024
Pillar-shaped semiconductor device and manufacturing method thereof
UNISANTIS ELECT SINGAPORE PTE2 citations73
US11862464B2Jan 2, 2024
Method for manufacturing three-dimensional semiconductor device
UNISANTIS ELECT SINGAPORE PTE2 citations73
US8609494B2Dec 17, 2013
Surround gate CMOS semiconductor device
UNISANTIS ELECT SINGAPORE PTE4 citations61
US9666688B2May 30, 2017
Semiconductor device production method and semiconductor device
UNISANTIS ELECT SINGAPORE PTE0 citations49
US9490362B2Nov 8, 2016
Semiconductor device production method and semiconductor device
UNISANTIS ELECT SINGAPORE PTE1 citations49
CHU SANFORD
3 patentsUS8293614B2Oct 23, 2012
High performance LDMOS device having enhanced dielectric strain layer
CHU SANFORD5 citations70
US8334567B2Dec 18, 2012
LDMOS using a combination of enhanced dielectric stress layer and dummy gates
CHU SANFORD3 citations61
US8163621B2Apr 24, 2012
High performance LDMOS device having enhanced dielectric strain layer
CHU SANFORD2 citations59